| Crystallography Open Database–an open-access collection of crystal structures S Gražulis, D Chateigner, RT Downs, AFT Yokochi, M Quirós, L Lutterotti, ... Journal of applied crystallography 42 (4), 726-729, 2009 | 1189 | 2009 |
| MAUD: a friendly Java program for material analysis using diffraction L Lutterotti, S Matthies, HR Wenk Newsletter of the CPD 21, 14-15, 1999 | 1068* | 1999 |
| Total pattern fitting for the combined size–strain–stress–texture determination in thin film diffraction L Lutterotti Nuclear Instruments and Methods in Physics Research Section B: Beam …, 2010 | 897 | 2010 |
| Crystallography Open Database (COD): an open-access collection of crystal structures and platform for world-wide collaboration S Gražulis, A Daškevič, A Merkys, D Chateigner, L Lutterotti, M Quiros, ... Nucleic acids research 40 (D1), D420-D427, 2012 | 868 | 2012 |
| Combined Texture and structure analysis of deformed limestone from time-of-flight neutron diffraction spectra L Lutterotti, S Matthies, HR Wenk, AS Schultz, R Jr. J. Applied Physics 81 (2), 594-600, 1997 | 809 | 1997 |
| Simultaneous structure and size–strain refinement by the Rietveld method L Lutterotti, P Scardi Journal of applied Crystallography 23 (4), 246-252, 1990 | 770 | 1990 |
| Rietveld texture analysis from diffraction images L Lutterotti, M Bortolotti, G Ischia, I Lonardelli, HR Wenk Z. Kristallogr. Suppl 26, 125-130, 2007 | 445 | 2007 |
| MAUD (material analysis using diffraction): a user friendly Java program for Rietveld texture analysis and more L Lutterotti, S Matthies, HR Wenk Proceeding of the twelfth international conference on textures of materials …, 1999 | 432 | 1999 |
| Texture, residual stress and structural analysis of thin films using a combined X-ray analysis L Lutterotti, D Chateigner, S Ferrari, J Ricote Thin Solid Films 450 (1), 34-41, 2004 | 427 | 2004 |
| Texture analysis with the new HIPPO TOF diffractometer HR Wenk, L Lutterotti, S Vogel Nuclear Instruments and Methods in Physics Research Section A: Accelerators …, 2003 | 394 | 2003 |
| Method for the simultaneous determination of anisotropic residual stresses and texture by x‐ray diffraction M Ferrari, L Lutterotti Journal of Applied Physics 76 (11), 7246-7255, 1994 | 381 | 1994 |
| X-ray diffraction characterization of heavily deformed metallic specimens L Lutterotti, S Gialanella Acta Materialia 46 (1), 101-110, 1998 | 351 | 1998 |
| Quantitative analysis of silicate glass in ceramic materials by the Rietveld method L Lutterotti, R Ceccato, R Dal Maschio, E Pagani Materials Science Forum 278 (281), 87-92, 1998 | 297 | 1998 |
| LSI-a computer program for simultaneous refinement of material structure and microstructure L Lutterotti, P Scardi, P Maistrelli Journal of Applied Crystallography 25 (3), 459-462, 1992 | 290 | 1992 |
| In situ observation of texture evolution during α→ β and β→ α phase transformations in titanium alloys investigated by neutron diffraction I Lonardelli, N Gey, HR Wenk, M Humbert, SC Vogel, L Lutterotti Acta Materialia 55 (17), 5718-5727, 2007 | 185 | 2007 |
| Rietveld texture analysis from TOF neutron diffraction data HR Wenk, L Lutterotti, SC Vogel Powder Diffraction 25 (3), 283-296, 2010 | 184 | 2010 |
| Advances in texture analysis from diffraction spectra S Matthies, L Lutteroti, HR Wenk Journal of Applied Crystallography 30 (1), 31-42, 1997 | 167 | 1997 |
| Texture measurements using the new neutron diffractometer HIPPO and their analysis using the Rietveld method SC Vogel, C Hartig, L Lutterotti, RB Von Dreele, HR Wenk, DJ Williams Powder Diffraction 19 (1), 65-68, 2004 | 153 | 2004 |
| Rietveld texture analysis from synchrotron diffraction images. I. Calibration and basic analysis L Lutterotti, R Vasin, HR Wenk Powder Diffraction 29 (1), 76-84, 2014 | 132 | 2014 |
| Texture analysis from synchrotron diffraction images with the Rietveld method: dinosaur tendon and salmon scale I Lonardelli, HR Wenk, L Lutterotti, M Goodwin Journal of Synchrotron Radiation 12 (3), 354-360, 2005 | 132 | 2005 |
Daniel ChateignerNormandie Université, CRISMAT, CNRS, ENSICAEN, IUT-Caen, UNICAENVerified email at ensicaen.fr
