| Characterization and modeling of power MOSFET switching times variations under constant electrical stress HG Sezgin, Y Özçelep Microelectronics Reliability 55 (3-4), 492-497, 2015 | 9 | 2015 |
| A New Approach for VDMOSFETs’ Gate Oxide Degradation Based on Capacitance and Subthreshold Current Measurements Under Constant Electrical Stress HG Sezgin-Ugranli, Y Özçelep IEEE Transactions on Electron Devices 65 (4), 1650-1652, 2018 | 8 | 2018 |
| Determination of Power MOSFET’s Gate Oxide Degradation Under Different Electrical Stress Levels Based on Stress-Induced Oxide Capacitance Changes HG Sezgin-Ugranlı, Y Özçelep IEEE Transactions on Electron Devices 68 (2), 688-696, 2021 | 5 | 2021 |
| Design of low power DTMOS based FCS and its notch filter application for ECG signals HG UGRANLI, M YILDIRIM, F KAÇAR Simulation 3, M4, 2017 | 2 | 2017 |
| Low Voltage Low Power DTMOS-CDTA Filter Design Using for Biomedical Signal Processing Applications M YILDIRIM, HG UGRANLI, F KAÇAR International Journal of Computational and Experimental Science and …, 2016 | 2 | 2016 |
| Modelling of Degraded Power MOSFET Effects on Inverter Static Parameters HG Sezgin, Y Özçelep Materials Today: Proceedings 3 (5), 1283-1290, 2016 | 2 | 2016 |
| Investigation of VDMOSFET's switching power dissipation changes under constant electrical stress HG Sezgin-Ugranlı, Y Özçelep Microelectronics Journal 78, 81-87, 2018 | | 2018 |
| Güç MOSFET’lerinde Elektriksel Sabit Yorma Kaynaklı Kapasite Değişimlerinin Analog Uygulamalara Etkileri The Effect of Electrical Constant Stress Induced Power MOSFET … HG SEZGİN, Y ÖZÇELEP | | 2014 |
YASİN ÖZÇELEPİstanbul Üniversitesi-CerrahpaşaVerified email at istanbul.edu.tr
