Takip et
Tim Niewelt
Tim Niewelt
warwick.ac.uk üzerinde doğrulanmış e-posta adresine sahip
Başlık
Alıntı yapanlar
Alıntı yapanlar
Yıl
Degradation of crystalline silicon due to boron–oxygen defects
T Niewelt, J Schön, W Warta, SW Glunz, MC Schubert
IEEE Journal of Photovoltaics 7 (1), 383-398, 2016
1742016
Understanding the light‐induced degradation at elevated temperatures: Similarities between multicrystalline and floatzone p‐type silicon
T Niewelt, F Schindler, W Kwapil, R Eberle, J Schön, MC Schubert
Progress in Photovoltaics: Research and Applications 26 (8), 533-542, 2018
1222018
Light-induced activation and deactivation of bulk defects in boron-doped float-zone silicon
T Niewelt, M Selinger, NE Grant, W Kwapil, JD Murphy, MC Schubert
Journal of Applied Physics 121 (18), 2017
1222017
Kinetics of carrier-induced degradation at elevated temperature in multicrystalline silicon solar cells
W Kwapil, T Niewelt, MC Schubert
Solar Energy Materials and Solar Cells 173, 80-84, 2017
922017
Reassessment of the intrinsic bulk recombination in crystalline silicon
T Niewelt, B Steinhauser, A Richter, B Veith-Wolf, A Fell, B Hammann, ...
Solar Energy Materials and Solar Cells 235, 111467, 2022
912022
Taking monocrystalline silicon to the ultimate lifetime limit
T Niewelt, A Richter, TC Kho, NE Grant, RS Bonilla, B Steinhauser, ...
Solar Energy Materials and Solar Cells 185, 252-259, 2018
632018
Gallium‐doped silicon for high‐efficiency commercial passivated emitter and rear solar cells
NE Grant, PP Altermatt, T Niewelt, R Post, W Kwapil, MC Schubert, ...
Solar RRL 5 (4), 2000754, 2021
502021
Superacid-treated silicon surfaces: Extending the limit of carrier lifetime for photovoltaic applications
NE Grant, T Niewelt, NR Wilson, EC Wheeler-Jones, J Bullock, M Al-Amin, ...
IEEE Journal of Photovoltaics 7 (6), 1574-1583, 2017
482017
Silicon‐based passivating contacts: The TOPCon route
SW Glunz, B Steinhauser, JI Polzin, C Luderer, B Grübel, T Niewelt, ...
Progress in Photovoltaics: Research and Applications 31 (4), 341-359, 2023
452023
Electrical characterization of the slow boron oxygen defect component in Czochralski silicon
T Niewelt, J Schön, J Broisch, W Warta, M Schubert
physica status solidi (RRL)–Rapid Research Letters 9 (12), 692-696, 2015
412015
Long-term stability of aluminum oxide based surface passivation schemes under illumination at elevated temperatures
T Niewelt, W Kwapil, M Selinger, A Richter, MC Schubert
IEEE Journal of Photovoltaics 7 (5), 1197-1202, 2017
372017
Thermal activation of hydrogen for defect passivation in poly-Si based passivating contacts
JI Polzin, B Hammann, T Niewelt, W Kwapil, M Hermle, F Feldmann
Solar Energy Materials and Solar Cells 230, 111267, 2021
352021
Spatially resolved impurity identification via temperature-and injection-dependent photoluminescence imaging
LE Mundt, MC Schubert, J Schön, B Michl, T Niewelt, F Schindler, ...
IEEE Journal of Photovoltaics 5 (5), 1503-1509, 2015
342015
Influence of dopant elements on degradation phenomena in B‐and Ga‐doped Czochralski‐grown silicon
W Kwapil, J Dalke, R Post, T Niewelt
Solar RRL 5 (5), 2100147, 2021
332021
Fast in-situ photoluminescence analysis for a recombination parameterization of the fast BO defect component in silicon
T Niewelt, S Mägdefessel, MC Schubert
Journal of Applied Physics 120 (8), 2016
322016
Temporary recovery of the defect responsible for light-and elevated temperature-induced degradation: Insights into the physical mechanisms behind LeTID
W Kwapil, J Schön, T Niewelt, MC Schubert
IEEE Journal of Photovoltaics 10 (6), 1591-1603, 2020
312020
Broad range injection-dependent minority carrier lifetime from photoluminescence
JA Giesecke, T Niewelt, M Rüdiger, M Rauer, MC Schubert, W Warta
Solar energy materials and solar cells 102, 220-224, 2012
292012
Characterization and modelling of the boron-oxygen defect activation in compensated n-type silicon
J Schön, T Niewelt, J Broisch, W Warta, MC Schubert
Journal of Applied Physics 118 (24), 2015
272015
Radiative recombination in silicon photovoltaics: modeling the influence of charge carrier densities and photon recycling
A Fell, T Niewelt, B Steinhauser, FD Heinz, MC Schubert, SW Glunz
Solar Energy Materials and Solar Cells 230, 111198, 2021
232021
Identification of lifetime limiting defects by temperature-and injection-dependent photoluminescence imaging
J Schön, A Youssef, S Park, LE Mundt, T Niewelt, S Mack, K Nakajima, ...
Journal of Applied Physics 120 (10), 2016
232016
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