Mustafa Tarik Sanic
Mustafa Tarik Sanic
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Impact of transistor scaling on the time-dependent dielectric breakdown (TDDB) reliability of analog circuits
MT SaniÁ, MB Yelten
2017 10th International Conference on Electrical and Electronics Engineering†…, 2017
Characterizing perception module performance and robustness in production-scale autonomous driving system
A Toschi, M Sanic, J Leng, Q Chen, C Wang, M Guo
IFIP International Conference on Network and Parallel Computing, 235-247, 2019
Time-dependent dielectric breakdown (TDDB) reliability analysis of CMOS analog and radio frequency (RF) circuits
MT SaniÁ, MB Yelten
Analog Integrated Circuits and Signal Processing 97 (1), 39-47, 2018
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