Mustafa Tarik Sanic
Mustafa Tarik Sanic
Verified email at sjtu.edu.cn
Title
Cited by
Cited by
Year
Impact of transistor scaling on the time-dependent dielectric breakdown (TDDB) reliability of analog circuits
MT SaniÁ, MB Yelten
2017 10th International Conference on Electrical and Electronics Engineering†…, 2017
32017
Characterizing perception module performance and robustness in production-scale autonomous driving system
A Toschi, M Sanic, J Leng, Q Chen, C Wang, M Guo
IFIP International Conference on Network and Parallel Computing, 235-247, 2019
12019
Time-dependent dielectric breakdown (TDDB) reliability analysis of CMOS analog and radio frequency (RF) circuits
MT SaniÁ, MB Yelten
Analog Integrated Circuits and Signal Processing 97 (1), 39-47, 2018
12018
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Articles 1–3