| Atomic force microscope anodization lithography using pulsed bias voltage synchronized with resonance frequency of cantilever S Bae, C Han, MS Kim, CC Chung, H Lee Nanotechnology 16 (10), 2082, 2005 | 29 | 2005 |
| Fabrication of uniform and high resolution copper nanowire using intermediate self-assembled monolayers through direct AFM lithography G Kwon, H Chu, J Yoo, H Kim, C Han, C Chung, J Lee, H Lee Nanotechnology 23 (18), 185307, 2012 | 21 | 2012 |
| Reconstruction of a scanned topographic image distorted by the creep effect of a Z scanner in atomic force microscopy C Han, CC Chung Review of Scientific Instruments 82 (5), 2011 | 15 | 2011 |
| Monochromator and charged particle apparatus including the same T Ogawa, BL Cho, SJ Ahn, IY Park, C Han US Patent 9,425,022, 2016 | 10 | 2016 |
| Feasibility of multi-walled carbon nanotube probes in AFM anodization lithography JS Choi, S Bae, SJ Ahn, KY Jung, C Han, CC Chung, H Lee Ultramicroscopy 107 (10-11), 1091-1094, 2007 | 5 | 2007 |
| Edge shadow projection method for measuring the brightness of electron guns C Han, I Sul, B Cho Review of Scientific Instruments 88 (2), 2017 | 4 | 2017 |
| Automatic approaching method for atomic force microscope using a Gaussian laser beam C Han, H Lee, CC Chung Review of Scientific Instruments 80 (7), 2009 | 4 | 2009 |
| Automatic landing method and apparatus for scanning probe microscope using the same H Lee, CC Chung, C Han US Patent 7,891,016, 2011 | 3 | 2011 |
| Digital Camera System in Transmission Electron Microscope C Han, JM Jeung, JG Kim, SC Lee Microscopy and Microanalysis 25 (S2), 546-547, 2019 | 2 | 2019 |
| Note: O-ring stack system for electron gun alignment IY Park, B Cho, C Han, S Shin, D Lee, SJ Ahn Review of Scientific Instruments 86 (1), 2015 | 2 | 2015 |
| Advanced flattening method for scanned atomic force microscopy images C Han, CC Chung Journal of the Korean Physical Society 60, 680-683, 2012 | 2 | 2012 |
| Ion source, and mass analysis apparatus including same CJ Park, JR Ahn, C Han, SJ Ahn US Patent 9,673,035, 2017 | 1 | 2017 |
| Optimization of closed ion source for a high-sensitivity residual gas analyzer C Han, S Jung Ahn, C Joon Park Journal of Vacuum Science & Technology A 32 (2), 2014 | 1 | 2014 |
| The influence of the resonant frequency of a tube-type piezo actuator on atomic force microscope anodization lithography S Bae, CH Park, C Han, CC Chung, G Kwon, H Lee Journal of the Korean Physical Society 51 (5), 1782-1786, 2007 | 1 | 2007 |
| Abnormal shadow contrast imaging for optimal objective lens condition in transmission electron microscope TYLJGK Yong-Eun Kwon, Cheolsu Han, Sang-Chul Lee, Jong-Man Jeung, Gaehang Lee Journal of Analytical Science and Technology 13 (14), 1-7, 2022 | | 2022 |
| Particle beam mass spectrometer and particle measurement method by means of same CJ Park, SJ Ahn, C Han, KC Lee, SR Yoon US Patent 10,283,339, 2019 | | 2019 |
| Inspection Tool for Testing an Electron Beam in an Electromagnetic Lens System C Han, JM Jeong, SC Lee, JG Kim Microscopy and Microanalysis 23 (S1), 518-519, 2017 | | 2017 |
| Line Patterning using a Scanning Probe Lithography Technique based on Convolution Method# C Han, K Gwangmin, SJ Ahn, H Lee, CC Chung Bulletin of the Korean Chemical Society 36 (3), 1024-1031, 2015 | | 2015 |
| 전자총 평가 시스템에서 영상처리기법 CS Han, BR Jo, JM Jeong, JG Kim Proceedings of the Korean Vacuum Society Conference, 229.2-229.2, 2015 | | 2015 |
| Blunted Tungsten Tip Cleaning by Nitrogen Gas Etching at Room Temperature without Tip Heating and Cooling IY Park, T Ogawa, B Cho, C Han, JH Kim, SJ Ahn Microscopy and Microanalysis 20 (S3), 348-349, 2014 | | 2014 |
