|Quantitative speciation of heavy metals in soils and sediments by synchrotron X-ray techniques|
A Manceau, MA Marcus, N Tamura
Reviews in Mineralogy and Geochemistry 49 (1), 341-428, 2002
|Scanning X-ray microdiffraction with submicrometer white beam for strain/stress and orientation mapping in thin films|
N Tamura, AA MacDowell, R Spolenak, BC Valek, JC Bravman, ...
Journal of synchrotron radiation 10 (2), 137-143, 2003
|Effect of surface microstructure on electrochemical performance of garnet solid electrolytes|
L Cheng, W Chen, M Kunz, K Persson, N Tamura, G Chen, M Doeff
ACS applied materials & interfaces 7 (3), 2073-2081, 2015
|Molecular-scale speciation of Zn and Ni in soil ferromanganese nodules from loess soils of the Mississippi Basin|
A Manceau, N Tamura, RS Celestre, AA MacDowell, N Geoffroy, ...
Environmental Science & Technology 37 (1), 75-80, 2003
|Tin whiskers studied by synchrotron radiation scanning X-ray micro-diffraction|
WJ Choi, TY Lee, KN Tu, N Tamura, RS Celestre, AA MacDowell, ...
Acta Materialia 51 (20), 6253-6261, 2003
|Evidence for a cluster-based structure of AlPdMn single quasicrystals|
P Ebert, M Feuerbacher, N Tamura, M Wollgarten, K Urban
Physical review letters 77 (18), 3827, 1996
|Submicron x-ray diffraction and its applications to problems in materials and environmental science|
N Tamura, RS Celestre, AA MacDowell, HA Padmore, R Spolenak, ...
Review of scientific instruments 73 (3), 1369-1372, 2002
|Extended mapping and exploration of the vanadium dioxide stress-temperature phase diagram|
J Cao, Y Gu, W Fan, LQ Chen, DF Ogletree, K Chen, N Tamura, M Kunz, ...
Nano letters 10 (7), 2667-2673, 2010
|Natural speciation of Zn at the micrometer scale in a clayey soil using X-ray fluorescence, absorption, and diffraction|
A Manceau, MA Marcus, N Tamura, O Proux, N Geoffroy, B Lanson
Geochimica et Cosmochimica Acta 68 (11), 2467-2483, 2004
|Mechanism of calcite co-orientation in the sea urchin tooth|
CE Killian, RA Metzler, YUT Gong, IC Olson, J Aizenberg, Y Politi, FH Wilt, ...
Journal of the American Chemical Society 131 (51), 18404-18409, 2009
|Synchrotron X-ray analytical techniques for studying materials electrochemistry in rechargeable batteries|
F Lin, Y Liu, X Yu, L Cheng, A Singer, OG Shpyrko, HL Xin, N Tamura, ...
Chemical reviews 117 (21), 13123-13186, 2017
|A dedicated superbend X-ray microdiffraction beamline for materials, geo-, and environmental sciences at the advanced light source|
M Kunz, N Tamura, K Chen, AA MacDowell, RS Celestre, MM Church, ...
Review of Scientific Instruments 80 (3), 035108, 2009
|Visualization of charge distribution in a lithium battery electrode|
J Liu, M Kunz, K Chen, N Tamura, TJ Richardson
The Journal of Physical Chemistry Letters 1 (14), 2120-2123, 2010
|Deciphering Ni sequestration in soil ferromanganese nodules by combining X-ray fluorescence, absorption, and diffraction at micrometer scales of resolution|
A Manceau, N Tamura, MA Marcus, AA MacDowell, RS Celestre, ...
American Mineralogist 87 (10), 1494-1499, 2002
|Mobile metallic domain walls in an all-in-all-out magnetic insulator|
EY Ma, YT Cui, K Ueda, S Tang, K Chen, N Tamura, PM Wu, J Fujioka, ...
Science 350 (6260), 538-541, 2015
|Using multi-criteria cost surface analysis to explore past regional landscapes: a case study of ritual activity and social interaction in Michigan, AD 1200–1600|
Journal of Archaeological Science 34 (11), 1830-1846, 2007
|X-ray microdiffraction study of growth modes and crystallographic tilts in oxide films on metal substrates|
JD Budai, W Yang, N Tamura, JS Chung, JZ Tischler, BC Larson, GE Ice, ...
Nature Materials 2 (7), 487-492, 2003
|Submicron X-ray diffraction|
AA MacDowell, RS Celestre, N Tamura, R Spolenak, B Valek, WL Brown, ...
Nuclear Instruments and Methods in Physics Research Section A: Accelerators …, 2001
|Natural speciation of Mn, Ni, and Zn at the micrometer scale in a clayey paddy soil using X-ray fluorescence, absorption, and diffraction|
A Manceau, C Tommaseo, S Rihs, N Geoffroy, D Chateigner, M Schlegel, ...
Geochimica et Cosmochimica Acta 69 (16), 4007-4034, 2005
|Measurement of stresses in Cu and Si around through-silicon via by synchrotron X-ray microdiffraction for 3-dimensional integrated circuits|
AS Budiman, HAS Shin, BJ Kim, SH Hwang, HY Son, MS Suh, QH Chung, ...
Microelectronics Reliability 52 (3), 530-533, 2012