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Nihat Tuğluoğlu
Nihat Tuğluoğlu
Verified email at giresun.edu.tr
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Cited by
Year
The role of interface states and series resistance on the I–V and C–V characteristics in Al/SnO2/p-Si Schottky diodes
Ş Altındal, S Karadeniz, N Tuğluoğlu, A Tataroğlu
Solid-State Electronics 47 (10), 1847-1854, 2003
2552003
Electrical, structural and optical properties of SnO2 thin films prepared by spray pyrolysis
T Serin, N Serin, S Karadeniz, H Sarı, N Tuğluoğlu, O Pakma
Journal of Non-Crystalline Solids 352 (3), 209-215, 2006
1762006
Space charge-limited conduction in Ag/p-Si Schottky diode
F Yakuphanoglu, N Tugluoglu, S Karadeniz
Physica B: Condensed Matter 392 (1-2), 188-191, 2007
772007
Frequency-dependent dielectric characteristics of Tl–Ba–Ca–Cu–O bulk superconductor
Ş Çavdar, H Koralay, N Tuğluoğlu, A Günen
Superconductor Science and Technology 18 (9), 1204, 2005
632005
Au/SnO2/n-Si (MOS) structures response to radiation and frequency
A Tataroğlu, Ş Altındal, S Karadeniz, N Tuğluoğlu
Microelectronics journal 34 (11), 1043-1049, 2003
612003
The energy distribution of the interface state density of SnO2/p-Si (1 1 1) heterojunctions prepared at different substrate temperatures by spray deposition method
S Karadeniz, N Tuğluoğlu, T Serin, N Serin
Applied surface science 246 (1-3), 30-35, 2005
592005
Analysis of current–voltage and capacitance–voltage characteristics of perylene-monoimide/n-Si Schottky contacts
N Tuğluoğlu, S Karadeniz
Current Applied Physics 12 (6), 1529-1535, 2012
572012
Electrical properties of Au/perylene-monoimide/p-Si Schottky diode
ÖF Yüksel, N Tuğluoğlu, B Gülveren, H Şafak, M Kuş
Journal of Alloys and Compounds 577, 30-36, 2013
542013
Determination of the interface state density of the In/p-Si Schottky diode by conductance and capacitance–frequency characteristics
N Tuğluoğlu, F Yakuphanoglu, S Karadeniz
Physica B: Condensed Matter 393 (1-2), 56-60, 2007
542007
Substrate temperature dependence of series resistance in Al/SnO2/p-Si (111) Schottky diodes prepared by spray deposition method
S Karadeniz, N Tuğluoğlu, T Serin
Applied surface science 233 (1-4), 5-13, 2004
492004
The modification of Schottky barrier height of Au/p-Si Schottky devices by perylene-diimide
ÖF Yüksel, N Tuğluoğlu, H Şafak, M Kuş
Journal of Applied Physics 113 (4), 2013
482013
Temperature-dependent barrier characteristics of Ag/p-SnSe Schottky diodes based on I–V–T measurements
N Tuğluoğlu, S Karadeniz, M Şahin, H Şafak
Semiconductor Science and Technology 19 (9), 1092, 2004
462004
Temperature dependence of current–voltage characteristics of Ag/p-SnSe Schottky diodes
N Tuğluoğlu, S Karadeniz, M Şahin, H Şafak
Applied surface science 233 (1-4), 320-327, 2004
442004
Temperature-dependent barrier characteristics of Ag/p-SnS Schottky barrier diodes
S Karadeniz, M Şahin, N Tuğluoğlu, H Şafak
Semiconductor science and technology 19 (9), 1098, 2004
432004
60Co γ-ray irradiation effects on the interface traps density of tin oxide films of different thicknesses on n-type Si (1 1 1) substrates
N Tuğluoğlu
Nuclear Instruments and Methods in Physics Research Section B: Beam …, 2007
362007
Optical dispersion and dielectric properties of rubrene organic semiconductor thin film
B Barış, HG Özdemir, N Tuğluoğlu, S Karadeniz, ÖF Yüksel, Z Kişnişci
Journal of Materials Science: Materials in Electronics 25, 3586-3593, 2014
352014
Analysis of temperature dependent electrical properties of Au/perylene-diimide/n-Si Schottky diodes
ÖF Yüksel, N Tuğluoğlu, H Şafak, Z Nalçacıgil, M Kuş, S Karadeniz
Thin Solid Films 534, 614-620, 2013
352013
Analysis of electrical properties of Al/p-Si Schottky contacts with and without rubrene layer
S Karadeniz, B Barış, ÖF Yüksel, N Tuğluoğlu
Synthetic metals 168, 16-22, 2013
342013
Investigation of optical band gap and device parameters of rubrene thin film prepared using spin coating technique
N Tuğluoğlu, B Barış, H Gürel, S Karadeniz, ÖF Yüksel
Journal of alloys and compounds 582, 696-702, 2014
332014
Temperature dependence of current–voltage characteristics of Ag/p-SnS Schottky barrier diodes
M Şahin, H Şafak, N Tuğluoğlu, S Karadeniz
Applied surface science 242 (3-4), 412-418, 2005
322005
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