| Feature computation in a sensor element array EP Gousev, A Govil, SY Kim, N Rasquinha, V Rangan US Patent 9,838,635, 2017 | 35 | 2017 |
| A compact SPICE model for statistical post-breakdown gate current increase due to TDDB SY Kim, G Panagopoulos, CH Ho, M Katoozi, E Cannon, K Roy 2013 IEEE International Reliability Physics Symposium (IRPS), 2A. 2.1-2A. 2.4, 2013 | 24 | 2013 |
| Ultra-thin dielectric breakdown in devices and circuits: A brief review CH Ho, SY Kim, K Roy Microelectronics Reliability 55 (2), 308-317, 2015 | 23 | 2015 |
| Column-selection-enabled 8T SRAM array with∼ 1R/1W multi-port operation for DVFS-enabled processors SP Park, SY Kim, D Lee, JJ Kim, WP Griffin, K Roy IEEE/ACM International Symposium on Low Power Electronics and Design, 303-308, 2011 | 23 | 2011 |
| Event based computer vision computation A Govil, SY Kim, EP Gousev US Patent 10,728,450, 2020 | 20 | 2020 |
| Design of an always-on image sensor using an analog lightweight convolutional neural network J Choi, S Lee, Y Son, SY Kim Sensors 20 (11), 3101, 2020 | 19 | 2020 |
| A multi-resolution mode CMOS image sensor with a novel two-step single-slope ADC for intelligent surveillance systems D Kim, M Song, B Choe, SY Kim Sensors 17 (7), 1497, 2017 | 19 | 2017 |
| Ultra-low power CMOS image sensor with two-step logical shift algorithm-based correlated double sampling scheme K Park, S Yeom, SY Kim IEEE Transactions on Circuits and Systems I: Regular Papers 67 (11), 3718-3727, 2020 | 17 | 2020 |
| Configurable hardware for computing computer vision features A Govil, EP Gousev, SY Kim US Patent 9,762,834, 2017 | 16 | 2017 |
| Design of an edge-detection cmos image sensor with built-in mask circuits M Jin, H Noh, M Song, SY Kim Sensors 20 (13), 3649, 2020 | 15 | 2020 |
| The design of a single-bit CMOS image sensor for iris recognition applications K Park, M Song, SY Kim Sensors 18 (2), 669, 2018 | 13 | 2018 |
| Device process and circuit application interaction for harsh electronics: Hf–In–Zn–O thin film transistors as an example CH Ho, DS Tsai, C Lu, SY Kim, S Mungan, SG Yang, Y Zhang, JH He IEEE Electron Device Letters 38 (8), 1039-1042, 2017 | 12 | 2017 |
| High-frequency modeling of poly-Si thin-film transistors for low-cost RF applications SY Kim, WF Loke, B Jung, K Roy IEEE transactions on electron devices 59 (9), 2296-2301, 2012 | 12 | 2012 |
| Analysis of stability degradation of SRAMs using a physics-based PBTI model CH Ho, MK Hassan, SY Kim, K Roy IEEE Electron Device Letters 35 (9), 951-953, 2014 | 11 | 2014 |
| A physics-based statistical model for reliability of STT-MRAM considering oxide variability CH Ho, GD Panagopoulos, SY Kim, Y Kim, D Lee, K Roy 2013 International Conference on Simulation of Semiconductor Processes and …, 2013 | 11 | 2013 |
| Pseudo-digital average sub sampling method and apparatus Y Lim, KM Koh, SY Kim US Patent 8,149,289, 2012 | 11 | 2012 |
| On-cmos image sensor processing for lane detection S Lee, B Jeong, K Park, M Song, SY Kim Sensors 21 (11), 3713, 2021 | 10 | 2021 |
| Statistical SBD modeling and characterization and its impact on SRAM cells SY Kim, CH Ho, K Roy IEEE Transactions on Electron Devices 61 (1), 54-59, 2013 | 9 | 2013 |
| A physical model to predict STT-MRAM performance degradation induced by TDDB CH Ho, GD Panagopoulos, SY Kim, Y Kim, D Lee, K Roy 71st Device Research Conference, 59-60, 2013 | 9 | 2013 |
| Highly sensitive UV photodiode composed of β-polyfluorene/YZnO nanorod organic-inorganic hybrid heterostructure Y Lee, SY Kim, DY Kim, S Lee Nanomaterials 10 (8), 1486, 2020 | 8 | 2020 |
Kaushik RoyProfessor of Electrical and Computer Engineering, Purdue UniversityVerified email at purdue.edu
Kaushik RoyProfessor of Electrical and Computer Engineering, Purdue UniversityVerified email at purdue.edu