Soo Youn Kim
Soo Youn Kim
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A compact SPICE model for statistical post-breakdown gate current increase due to TDDB
SY Kim, G Panagopoulos, CH Ho, M Katoozi, E Cannon, K Roy
2013 IEEE International Reliability Physics Symposium (IRPS), 2A. 2.1-2A. 2.4, 2013
Column-selection-enabled 8T SRAM array with∼ 1R/1W multi-port operation for DVFS-enabled processors
SP Park, SY Kim, D Lee, JJ Kim, WP Griffin, K Roy
IEEE/ACM International Symposium on Low Power Electronics and Design, 303-308, 2011
Feature computation in a sensor element array
EP Gousev, A Govil, SY Kim, N Rasquinha, V Rangan
US Patent 9,838,635, 2017
Ultra-thin dielectric breakdown in devices and circuits: A brief review
CH Ho, SY Kim, K Roy
Microelectronics Reliability 55 (2), 308-317, 2015
A multi-resolution mode CMOS image sensor with a novel two-step single-slope ADC for intelligent surveillance systems
D Kim, M Song, B Choe, SY Kim
Sensors 17 (7), 1497, 2017
Pseudo-digital average sub sampling method and apparatus
Y Lim, KM Koh, SY Kim
US Patent 8,149,289, 2012
Statistical SBD modeling and characterization and its impact on SRAM cells
SY Kim, CH Ho, K Roy
IEEE Transactions on Electron Devices 61 (1), 54-59, 2013
High-frequency modeling of poly-Si thin-film transistors for low-cost RF applications
SY Kim, WF Loke, B Jung, K Roy
IEEE transactions on electron devices 59 (9), 2296-2301, 2012
Thin-BOX poly-Si thin-film transistors for CMOS-compatible analog operations
SY Kim, S Baytok, K Roy
IEEE transactions on electron devices 58 (6), 1687-1695, 2011
Analysis of stability degradation of SRAMs using a physics-based PBTI model
CH Ho, MK Hassan, SY Kim, K Roy
IEEE Electron Device Letters 35 (9), 951-953, 2014
A physical model to predict STT-MRAM performance degradation induced by TDDB
CH Ho, GD Panagopoulos, SY Kim, Y Kim, D Lee, K Roy
71st Device Research Conference, 59-60, 2013
Scaled LTPS TFTs for low-cost low-power applications
SY Kim, S Baytok, K Roy
2011 12th International Symposium on Quality Electronic Design, 1-6, 2011
A physics-based statistical model for reliability of STT-MRAM considering oxide variability
CH Ho, GD Panagopoulos, SY Kim, Y Kim, D Lee, K Roy
2013 International Conference on Simulation of Semiconductor Processes and …, 2013
The design of a single-bit CMOS image sensor for iris recognition applications
K Park, M Song, SY Kim
Sensors 18 (2), 669, 2018
Device process and circuit application interaction for harsh electronics: Hf–In–Zn–O thin film transistors as an example
CH Ho, DS Tsai, C Lu, SY Kim, S Mungan, SG Yang, Y Zhang, JH He
IEEE Electron Device Letters 38 (8), 1039-1042, 2017
Event based computer vision computation
A Govil, SY Kim, EP Gousev
US Patent App. 14/859,146, 2016
Low-power column counter with a logical-shift algorithm for CMOS image sensors
K Park, SY Kim
Electronics Letters 56 (5), 232-234, 2020
Pseudo-digital average sub sampling method and apparatus
Y Lim, KM Koh, SY Kim
US Patent 8,754,956, 2014
Correlated double sampling unit in image sensor with attenuation of parasitic voltage loss
SY Kim, KM Shin
US Patent 8,159,583, 2012
Physics-based compact modeling of successive breakdown in ultrathin oxides
G Panagopoulos, CH Ho, SY Kim, K Roy
IEEE Transactions on Nanotechnology 14 (1), 7-9, 2014
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