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Yi Zhou
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Fabrication of micro-optics elements with arbitrary surface profiles based on one-step maskless grayscale lithography
Q Deng, Y Yang, H Gao, Y Zhou, Y He, S Hu
Micromachines 8 (10), 314, 2017
472017
Surface and thickness measurement of transparent thin-film layers utilizing modulation-based structured-illumination microscopy
Z Xie, Y Tang, Y Zhou, Q Deng
Optics express 26 (3), 2944-2953, 2018
382018
Contrast enhancement of microsphere-assisted super-resolution imaging in dark-field microscopy
Y Zhou, Y Tang, Q Deng, L Zhao, S Hu
Applied Physics Express 10 (8), 082501, 2017
222017
Effects of immersion depth on super-resolution properties of index-different microsphere-assisted nanoimaging
Y Zhou, Y Tang, Y He, X Liu, S Hu
Applied Physics Express 11 (3), 032501, 2018
192018
Spatial frequency domain correlation mapping optical coherence tomography for nanoscale structural characterization
S Alexandrov, PM McNamara, N Das, Y Zhou, G Lynch, J Hogan, ...
Applied Physics Letters 115 (12), 2019
132019
Noninvasive detection of nanoscale structural changes in cornea associated with cross‐linking treatment
Y Zhou, S Alexandrov, A Nolan, N Das, R Dey, M Leahy
Journal of Biophotonics 13 (6), e201960234, 2020
92020
Noninvasive detection of nanoscale structural changes in cornea associated with cross‐linking treatment
Y Zhou, S Alexandrov, A Nolan, N Das, R Dey, M Leahy
Journal of Biophotonics 13 (6), e201960234, 2020
92020
Spatial modulation-assisted scanning white-light interferometry for noise suppression
Q Deng, J Liu, Y Tang, Y Zhou, Y Yang, J Li, S Hu
IEEE Photonics Technology Letters 30 (4), 379-382, 2017
82017
Dimensional metrology of smooth micro structures utilizing the spatial modulation of white-light interference fringes
Y Zhou, Y Tang, Q Deng, J Liu, J Wang, L Zhao
Optics & Laser Technology 93, 187-193, 2017
82017
Characterization of micro structure through hybrid interference and phase determination in broadband light interferometry
Y Zhou, Y Tang, J Zhu, Q Deng, Y Yang, L Zhao, S Hu
Applied Optics 56 (8), 2301-2306, 2017
72017
Thickness measurement of transparent film by white-light interferometry
Q Deng, Y Zhou, J Liu, J Yao, S Hu
8th International Symposium on Advanced Optical Manufacturing and Testing …, 2016
52016
Topography Measurement of Large-Range Microstructures through Advanced Fourier-Transform Method and Phase Stitching in Scanning Broadband Light Interferometry
Y Zhou, Y Tang, Y Yang, S Hu
Micromachines 8 (11), 319, 2017
32017
Development of HR-SD-OCT system using supercontinuum light source and its application in detecting nanoscale changes
R Dey, Y Zhou, N Das, S Alexandrov, A Nolan, K Neuhaus, M Leahy
Optical Coherence Tomography and Coherence Domain Optical Methods in …, 2020
12020
Application of over-sampling nano-sensitive optical coherence tomography for monitoring corneal internal structural changes in corneal cross-linking
Y Zhou, S Alexandrov, A Nolan, R Dey, N Das, K Neuhaus, M Leahy
Optical Coherence Tomography and Coherence Domain Optical Methods in …, 2020
12020
Moire-based interferometry for magnification calibration of bitelecentric lens system
Y Zhou, J Zhu, Q Deng, J Liu, X Si, S Hu
IEEE Photonics Journal 7 (6), 1-11, 2015
12015
Dimensional metrology of micro structure based on modulation depth in scanning broadband light interferometry
Y Zhou, Y Tang, Q Deng, L Zhao, S Hu
Applied Optical Metrology II 10373, 101-107, 2017
2017
Topography measurement of micro structure by modulation-based method
Y Zhou, Y Tang, J Liu, Q Deng, Y Cheng, S Hu
8th International Symposium on Advanced Optical Manufacturing and Testing …, 2016
2016
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Articles 1–17