| Forming‐free grain boundary engineered hafnium oxide resistive random access memory devices S Petzold, A Zintler, R Eilhardt, E Piros, N Kaiser, SU Sharath, T Vogel, ... Advanced Electronic Materials 5 (10), 1900484, 2019 | 72 | 2019 |
| Defect-stabilized substoichiometric polymorphs of hafnium oxide with semiconducting properties N Kaiser, T Vogel, A Zintler, S Petzold, A Arzumanov, E Piros, R Eilhardt, ... ACS Applied Materials & Interfaces 14 (1), 1290-1303, 2021 | 34 | 2021 |
| Analysis and simulation of the multiple resistive switching modes occurring in HfOx-based resistive random access memories using memdiodes S Petzold, E Miranda, SU Sharath, J Muñoz-Gorriz, T Vogel, E Piros, ... Journal of applied physics 125 (23), 2019 | 34 | 2019 |
| Tailoring the Switching Dynamics in Yttrium Oxide‐Based RRAM Devices by Oxygen Engineering: From Digital to Multi‐Level Quantization toward Analog Switching S Petzold, E Piros, R Eilhardt, A Zintler, T Vogel, N Kaiser, A Radetinac, ... Advanced Electronic Materials 6 (11), 2000439, 2020 | 29 | 2020 |
| Enhanced thermal stability of yttrium oxide-based RRAM devices with inhomogeneous Schottky-barrier E Piros, S Petzold, A Zintler, N Kaiser, T Vogel, R Eilhardt, C Wenger, ... Applied Physics Letters 117 (1), 2020 | 29 | 2020 |
| Role of Oxygen Defects in Conductive-Filament Formation in -Based Analog RRAM Devices as Revealed by Fluctuation Spectroscopy E Piros, M Lonsky, S Petzold, A Zintler, SU Sharath, T Vogel, N Kaiser, ... Physical Review Applied 14 (3), 034029, 2020 | 18 | 2020 |
| The Effect of Interfacial Charge Distribution on Chemical Compatibility and Stability of the High Voltage Electrodes (LiCoPO4, LiNiPO4)/Solid Electrolyte (LiPON … G Cherkashinin, Z Yu, R Eilhardt, L Alff, W Jaegermann Advanced Materials Interfaces 7 (12), 2000276, 2020 | 12 | 2020 |
| Controlling the formation of conductive pathways in memristive devices R Winkler, A Zintler, S Petzold, E Piros, N Kaiser, T Vogel, D Nasiou, ... Advanced Science 9 (33), 2201806, 2022 | 9 | 2022 |
| Structural and electrical response of emerging memories exposed to heavy ion radiation T Vogel, A Zintler, N Kaiser, N Guillaume, G Lefèvre, M Lederer, AL Serra, ... ACS nano 16 (9), 14463-14478, 2022 | 9 | 2022 |
| Olivine-LiNiPO4 thin films: Chemical compatibility with liquid electrolyte and interface stability at high potential G Cherkashinin, R Eilhardt, MV Lebedev, S Nappini, E Magnano, ... Journal of The Electrochemical Society 165 (4), H3143, 2018 | 9 | 2018 |
| Epitaxy Induced Highly Ordered Sm2Co17–SmCo5 Nanoscale Thin-Film Magnets S Sharma, A Zintler, D Günzing, J Lill, DM Meira, R Eilhardt, HK Singh, ... ACS applied materials & interfaces 13 (27), 32415-32423, 2021 | 8 | 2021 |
| The role of interstitial Cu on thermoelectric properties of ZrNiSn half-Heusler compounds R Yan, C Shen, M Widenmeyer, T Luo, R Winkler, E Adabifiroozjaei, R Xie, ... Materials Today Physics 33, 101049, 2023 | 5 | 2023 |
| Energy level alignment at the cobalt phosphate/electrolyte interface: Intrinsic stability vs interfacial chemical reactions in 5 V lithium ion batteries G Cherkashinin, R Eilhardt, S Nappini, M Cococcioni, I Pis, S Dal Zilio, ... ACS Applied Materials & Interfaces 14 (1), 543-556, 2021 | 5 | 2021 |
| Operando two-terminal devices inside a transmission electron microscope O Recalde-Benitez, T Jiang, R Winkler, Y Ruan, A Zintler, ... Communications Engineering 2 (1), 83, 2023 | 4 | 2023 |
| Oxide thickness-dependent resistive switching characteristics of Cu/HfO2/Pt ECM devices T Kim, T Vogel, E Piros, D Nasiou, N Kaiser, P Schreyer, R Winkler, ... Applied Physics Letters 122 (2), 2023 | 3 | 2023 |
| Machine learning assisted pattern matching: Insight into oxide electronic device performance by phase determination in 4D-STEM datasets A Zintler, R Eilhardt, S Wang, M Krajnak, P Schramowski, W Stammer, ... Microscopy and Microanalysis 26 (S2), 1908-1909, 2020 | 3 | 2020 |
| Controlling the Formation of Conductive Pathways in Memristive Devices (Adv. Sci. 33/2022) R Winkler, A Zintler, S Petzold, E Piros, N Kaiser, T Vogel, D Nasiou, ... Advanced Science 9 (33), 2270212, 2022 | 2 | 2022 |
| Effect of Induced Stimuli on the Leakage Current of Operative Oxide-based Devices inside a TEM O Recalde, T Jiang, R Eilhardt, A Zintler, Y Ruan, A Arzumanov, ... Microscopy and Microanalysis 28 (S1), 820-821, 2022 | 2 | 2022 |
| Enhanced Conductivity and Microstructure in Highly Textured TiN1–x/c-Al2O3 Thin Films A Zintler, R Eilhardt, S Petzold, SU Sharath, E Bruder, N Kaiser, L Alff, ... ACS omega 7 (2), 2041-2048, 2022 | 2 | 2022 |
| Birth of a grain boundary: In situ TEM Observation of the Microstructure Evolution in HfO2 Based Memristors R Eilhardt, A Zintler, O Recalde, D Nasiou, S Petzold, L Alff, ... Microscopy and Microanalysis 27 (S1), 1238-1239, 2021 | 2 | 2021 |
Leopoldo Molina-LunaProfessor, TU Darmstadt, Materials Science, Advanced Electron Microscopy (AEM) DivisionVerified email at aem.tu-darmstadt.de
