Takip et
Seyed Arash Sheikholeslam
Seyed Arash Sheikholeslam
imf.org üzerinde doğrulanmış e-posta adresine sahip
Başlık
Alıntı yapanlar
Alıntı yapanlar
Yıl
Reduced hydrogen diffusion in strained amorphous SiO 2: understanding ageing in MOSFET devices
SA Sheikholeslam, H Manzano, C Grecu, A Ivanov
Journal of Materials Chemistry C 4 (34), 8104-8110, 2016
302016
CMOS reliability from past to future: A survey of requirements, trends, and prediction methods
I Hill, P Chanawala, R Singh, SA Sheikholeslam, A Ivanov
IEEE Transactions on Device and Materials Reliability 22 (1), 1-18, 2021
152021
Generation and properties of bulk a-ZrO2 by molecular dynamics simulations with a reactive force field
SA Sheikholeslam, GM Xia, C Grecu, A Ivanov
Thin Solid Films 594, 172-177, 2015
82015
Hydrogen dissociation and diffusion near the Si< 111>/a-SiO2 interface: Understanding degradation in MOSFETs
SA Sheikholeslam, H Manzano, C Grecu, A Ivanov
Superlattices and Microstructures 120, 561-568, 2018
72018
Hydrogen diffusion in amorphous ZrO2
SA Sheikholeslam, W Luo, C Grecu, GM Xia, A Ivanov
Journal of Non-Crystalline Solids 440, 7-11, 2016
72016
Lexicodes over rings
K Guenda, TA Gulliver, SA Sheikholeslam
Designs, codes and cryptography 72 (3), 749-763, 2014
72014
Hydrogen diffusion characterization of amorphous Yttrium Stabilized Zirconia dielectrics
SA Sheikholeslam, C Grecu, H Manzano, A Ivanov
2016 IEEE 16th International Conference on Nanotechnology (IEEE-NANO), 164-166, 2016
42016
Using magnetic controlled electromigration for electrod fabrication
SA Sheikholeslam, C Grecu, A Ivanov
14th IEEE International Conference on Nanotechnology, 839-842, 2014
22014
Relationship between Atomic Structure, Composition, and Dielectric Constant in Zr–SiO2 Glasses
SA Sheikholeslam, J López-Zorrilla, H Manzano, S Pourtavakoli, A Ivanov
ACS omega 6 (43), 28561-28568, 2021
12021
An investigation of age-causing molecular phenomena at the gate-dielectric channel interface of MOSFET devices
SA Sheikholeslam
University of British Columbia, 2018
12018
Greedy codes over Z4
K Guenda, TA Gulliver, SA Sheikholeslam
2012 IEEE International Symposium on Information Theory Proceedings, 3106-3109, 2012
12012
VioNet: A Hierarchical Detailed Routing Wire-short Violation Predictor Based on a Convolutional Neural Network
Y Pan, Z Zhou, SA Sheikholeslam, A Ivanov
IEEE Design & Test, 2023
2023
Prediction of Thermally Accelerated Aging Process at 28nm
PA Chanawala, I Hill, SA Sheikholeslam, A Ivanov
2022 IEEE European Test Symposium (ETS), 1-2, 2022
2022
POS1-Prediction of Thermally Accelerated Aging Process at 28nm
PA Chanawala, I Hill, SA Sheikholeslam, A Ivanov
2022
Molecular Phenomena in MOSFET Gate Dielectrics and Interfaces
SA Sheikholeslam, H Manzano, C Grecu, A Ivanov
Energy Efficient Computing & Electronics, 51-66, 2019
2019
A novel tri-state device implemented with a metal gated QCA
SA Sheikholeslam, C Grecu, A Ivanov
2014 IEEE 5th Latin American Symposium on Circuits and Systems, 1-3, 2014
2014
A 10T Soft-Error-Immune SRAM With Multi-Node Upset Recovery for Low-Power Space Applications......................
I Hill, P Chanawala, R Singh, SA Sheikholeslam, A Ivanov, JH Park, ...
A molecular dynamics study of the causes of defects at dielectric/substrate interface of Ge MOSFETs
A Heydari, SA Sheikholeslam, C Grecu, A Ivanov
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Makaleler 1–18