Takip et
YUSUF ATICI
YUSUF ATICI
Bilinmeyen bağlantı
firat.edu.tr üzerinde doğrulanmış e-posta adresine sahip
Başlık
Alıntı yapanlar
Alıntı yapanlar
Yıl
AC conductivity and dielectric behavior of [Cd (phen) 2 (SCN) 2]
U Akgul, Z Ergin, M Sekerci, Y Atici
Vacuum 82 (3), 340-345, 2007
602007
Investigation of structural and electrical properties of Zirconium dioxide thin films deposited by reactive RF sputtering technique
B Coskun, T Asar, U Akgul, K Yildiz, Y Atici
Ferroelectrics 502 (1), 147-158, 2016
172016
Electron microscopy study of thermoelectric n-type Bi2 (Te0. 9Se0. 1) 3 film deposited by dc sputtering
K Yildiz, U Akgul, HS Leipner, Y Atici
Superlattices and Microstructures 58, 60-71, 2013
172013
Studies of lattice mismatch and threading dislocations in GaAs/Si grown by MBE
M Kaya, Y Atici
Superlattices and Microstructures 35 (1-2), 35-44, 2004
132004
Study of threading dislocations in the plan-view sample of SiGe/Si (001) superlattices by transmission electron microscopy
Y Atici
Journal of electronic materials 34, 612-616, 2005
112005
Influence of annealing time on the physical properties of reactively sputtered CuO thin film
U Akgul, K Yildiz, Y Atici
Journal of Materials Science: Materials in Electronics 28, 4758-4762, 2017
72017
Effect of annealing temperature on morphological, structural and optical properties of nanostructured CuO thin film
U Akgul, K Yildiz, Y Atici
The European Physical Journal Plus 131, 1-6, 2016
72016
Rf-sputtering deposition of nano-crystalline zirconia thin films with high transparency
K Yildiz, U Akgul, B Coskun, Y Atici
Materials Letters 94, 161-164, 2013
72013
Observation of crystal distortions in SiGeSi superlattice using a new application of large-angle convergent-beam electron diffraction
Y Atici, D Cherns
Ultramicroscopy 58 (3-4), 435-440, 1995
51995
Defects generated by misfit strain in SiGe/Si (001)
Y Atici
Physical Review B 51 (19), 13249, 1995
31995
Observation of defects and tetragonal distortions in InxGa1− xAsGaAs (001) heterostructures by TEM
Y Atici
Journal of crystal growth 156 (3), 147-154, 1995
21995
Transmission electron microscope study of surface steps on SiGe/Si (001) superlattices produced by differential etching
Y Atici, D Cherns
Journal of crystal growth 154 (3-4), 262-268, 1995
21995
Studies of interface structures of W films grown on patterned and bare Si (100) by TEM
Y Atici
Applied Physics A 65, 307-314, 1997
11997
Interface Structures and Electrical Properties of W/Si Films Grown by LPCVD
Y Atici, ME Yakinci, B ULUĞ, Y AYDOĞDU
Turkish Journal of Physics 20 (7), 753-759, 1996
11996
Microstructural analysis of W/Si films grown by LPCVD
Y Atici, D Cherns, H Nicholls
Unknown, 225-228, 1991
11991
Electron Microscopy of Cracks in Multi-Quantum Wells
Y Atici, K Yildiz, U Akgul
Acta Physica Polonica A 127 (3), 859-862, 2015
2015
Microstructure of thermoelectric (Bi {sub 0.15} Sb {sub 0.85}){sub 2} Te {sub 3} film
K Yildiz, U Akgul, Y Atici, HS Leipner
Applied Physics. A, Materials Science and Processing 117, 2014
2014
Microstructure of thermoelectric (Bi0.15Sb0.85)2Te3 film
K Yildiz, U Akgul, HS Leipner, Y Atici
Applied Physics A 117, 1387-1392, 2014
2014
Koksal Yildiz, Unal Akgul, Hartmut
S Leipner, Y Atici
Appl. Phys. A 117, 1387-1392, 2014
2014
Studies of Al‐Ti Alloys by SEM
K Yildiz, Y Atici, K Keşli̇oǧlu, E Yaşar
AIP Conference Proceedings 899 (1), 669-669, 2007
2007
Sistem, işlemi şu anda gerçekleştiremiyor. Daha sonra yeniden deneyin.
Makaleler 1–20