Strain doping: Reversible single-axis control of a complex oxide lattice via helium implantation H Guo, S Dong, PD Rack, JD Budai, C Beekman, Z Gai, W Siemons, ... Physical review letters 114 (25), 256801, 2015 | 104 | 2015 |
Fundamental resolution limits during electron-induced direct-write synthesis G Arnold, R Timilsina, J Fowlkes, A Orthacker, G Kothleitner, PD Rack, ... ACS applied materials & interfaces 6 (10), 7380-7387, 2014 | 42 | 2014 |
Focused helium and neon ion beam induced etching for advanced extreme ultraviolet lithography mask repair C Gonzalez, R Timilsina, G Li, G Duscher, P Rack, W Slingenbergh, ... journal of vaccum science and technology B 32 (2), 021602, 2014 | 41 | 2014 |
Synthesis of Nanowires via Helium and Neon Focused Ion Beam Induced Deposition with the Gas Field Ion Microscope HM Wu, L Stern, JH Chen, M Huth, CH Schwalb, M Winhold, F Porrati, ... Nanotechnology, 2013 | 37 | 2013 |
Monte Carlo simulations of nanoscale focused neon ion beam sputtering R Timilsina, PD Rack Nanotechnology 24 (49), 495303, 2013 | 34 | 2013 |
Monte Carlo simulations of nanoscale focused neon ion beam sputtering of copper: elucidating resolution limits and sub-surface damage R Timilsina, S Tan, R Livengood, PD Rack Nanotechnology 25 (48), 485704, 2014 | 32 | 2014 |
A comparison of neon versus helium ion beam induced deposition via Monte Carlo simulations R Timilsina, DA Smith, PD Rack Nanotechnology 24 (11), 115302, 2013 | 32 | 2013 |
Evaluation of mask repair strategies via focused electron, helium, and neon beam induced processing for EUV applications CM Gonzalez, W Slingenbergh, R Timilsina, JH Noh, MG Standford, ... SPIE Proceeding,Extreme Ultraviolet (EUV) Lithography 9048, 90480M, 2014 | 19 | 2014 |
Vacancies, microstructure and the moments of nuclear magnetic resonance: the case of hydrogenated amorphous silicon P Biswas, R Timilsina Journal of Physics: Condensed Matter 23 (6), 065801, 2011 | 16 | 2011 |
Pulsed Laser-Assisted Focused Electron-Beam-Induced Etching of Titanium with XeF2: Enhanced Reaction Rate and Precursor Transport JH Noh, JD Fowlkes, R Timilsina, MG Stanford, BB Lewis, PD Rack ACS applied materials & interfaces 7 (7), 4179-4184, 2015 | 13 | 2015 |
A study of hydrogen microstructure in amorphous silicon via inversion of nuclear magnetic resonance spectra R Timilsina, P Biswas Journal of Physics:Condens Matter Physics 25 (16), 165801, 2013 | 12 | 2013 |
Theoretical study of hydrogen microstructure in models of hydrogenated amorphous silicon R Timilsina, P Biswas physica status solidi (a) 207 (3), 609-612, 2010 | 9 | 2010 |
Chaotic dynamics of a driven pendulum R Timilsina University of Southern Mississippi, 0 | 2 | |
Monte Carlo simulations of focused ion beam induced processing R Timilsina, PD Rack Helium Ion Microscopy, 89-118, 2016 | 1 | 2016 |
Sensitivity Analysis of Composite Patch Design Parameters under Low Velocity Impact Loading Conditions SC TerMaath, R Timilsina 57th AIAA/ASCE/AHS/ASC Structures, Structural Dynamics, and Materials …, 2016 | 1 | 2016 |
Voids and molecuar hydrogen in hydrogenated amorphous silicon R Timilsina, P Biswas APS March Meeting Abstracts 2012, B53. 014, 2012 | 1 | 2012 |
Microstructure, vacancies and voids in hydrogenated amorphous silicon R Timilsina The University of Southern Mississippi, 2012 | 1 | 2012 |
Interview with Professor Dilli Ram Dahal MB Khattri, M Subedi, RR Timilsina Dhaulagiri Journal of Sociology and Anthropology, 67-78, 2023 | | 2023 |
Evaluation of the effects of design uncertainty on the damage tolerance of composite patches S TerMaath, J Retherford, E Stevens, R Timilsina Life-Cycle of Engineering Systems: Emphasis on Sustainable Civil …, 2016 | | 2016 |
\textbf {A parametric study of surface roughness and bonding mechanisms of aluminum alloys with epoxies: a molecular dynamics simulation.} R Timilsina, S TerMaath Bulletin of the American Physical Society 61, 2016 | | 2016 |