| Comparison of Reaction-Diffusion and Atomistic Trap-based BTI Models for Logic Gates H Kukner, S Khan, P Weckx, P Raghavan, S Hamdioui, B Kaczer, ... IEEE Transactions on Device and Materials Reliability 14 (1), 182-193, 2014 | 73 | 2014 |
| Defect-based Methodology for Workload-dependent Circuit Lifetime Projections – Application to SRAM P Weckx, B Kaczer, M Toledano-Luque, T Grasser, PJ Roussel, H Kukner, ... IRPS'13: IEEE International Reliability Physics Symposium, 2013 | 67 | 2013 |
| Bias Temperature Instability Analysis of FinFET based SRAM cells S Khan, I Agbo, S Hamdioui, H Kukner, B Kaczer, P Raghavan, F Catthoor DATE'14: 17th Design, Automation & Test in Europe Conference, 2014 | 62 | 2014 |
| BTI Impacts on Logical Gates in Nano-scale CMOS Technology S Khan, S Hamdioui, H Kukner, F Catthoor, P Raghavan DDECS'12: IEEE 15th Symposium on Design and Diagnostics of Electronic …, 2012 | 56 | 2012 |
| Dynamically variable step search motion estimation algorithm and a dynamically reconfigurable hardware for its implementation O Tasdizen, A Akin, H Kukner, I Hamzaoglu IEEE Transactions on Consumer Electronics 55 (3), 1645-1653, 2009 | 50 | 2009 |
| Integral Impact of BTI, PVT Variation, and Workload on SRAM Sense Amplifier I Agbo, M Taouil, D Kraak, S Hamdioui, H Kükner, P Weckx, P Raghavan, ... IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 2017 | 41 | 2017 |
| Degradation Analysis of Datapath Logic Subblocks under NBTI Aging in FinFET Technology H Kükner, M Khatib, S Morrison, P Weckx, P Raghavan, B Kaczer, ... ISQED'14: IEEE 15th International Symposium on Quality Electronic Design, 2014 | 30 | 2014 |
| Non-Monte-Carlo Methodology for High-Sigma Simulations of Circuits Under Workload-Dependent BTI Degradation—Application to 6T SRAM P Weckx, B Kaczer, H Kukner, PJ Roussel, P Raghavan, F Catthoor, ... IRPS'14: IEEE 52nd International Reliability Physics Symposium, 2014 | 29 | 2014 |
| Generic, orthogonal and low-cost March Element based memory BIST AJ van de Goor, S Hamdioui, H Kukner ITC'11: IEEE International Test Conference, 1-10, 2011 | 29 | 2011 |
| Scaling of BTI reliability in presence of time-zero variability H Kukner, P Weckx, J Franco, M Toledano-Luque, M Cho, B Kaczer, ... IRPS'14: IEEE 52nd International Reliability Physics Symposium, CA. 5.1-CA. 5.7, 2014 | 22 | 2014 |
| The defect-centric perspective of device and circuit reliability—From individual defects to circuits B Kaczer, J Franco, P Weckx, PJ Roussel, E Bury, M Cho, R Degraeve, ... ESSDERC'15: IEEE 45th European Solid-State Device Research Conference, 218-225, 2015 | 21 | 2015 |
| The impact of process variation and stochastic aging in nanoscale VLSI S Kiamehr, P Weckx, M Tahoori, B Kaczer, H Kukner, P Raghavan, ... IRPS'16: IEEE International Reliability Physics Symposium, CR-1-1-CR-1-6, 2016 | 19 | 2016 |
| Integral Impact of BTI and Voltage Temperature variation on SRAM Sense Amplifier I Agbo, M Taouil, S Hamdioui, H Kukner, P Raghavan, F Catthoor VTS'15: IEEE VLSI Test Symposium, Napa, CA, USA, 2015 | 19 | 2015 |
| Incorporating Parameter Variations in BTI Impact on Nano-scale Logical Gates Analysis S Khan, S Hamdioui, H Kukner, P Raghavan, F Catthoor DFT’12: IEEE International Symposium on Defect and Fault Tolerance in VLSI …, 2012 | 19 | 2012 |
| Impact of partial resistive defects and Bias Temperature Instability on SRAM decoder reliablity S Khan, M Taouil, S Hamdioui, H Kukner, P Raghavan, F Catthoor IDT'13: IEEE 8th International Design and Test Symposium, 1-6, 2013 | 13 | 2013 |
| Optimizing memory BIST Address Generator implementations AJ van de Goor, H Kukner, S Hamdioui DTIS'11: IEEE 6th International Conference on Design & Technology of …, 2011 | 13 | 2011 |
| NBTI aging on 32-bit adders in the downscaling planar FET technology nodes H Kukner, P Weckx, S Morrison, P Raghavan, B Kaczer, F Catthoor, ... DSD'14: 17th Euromicro Conference on Digital System Design, 98-107, 2014 | 11 | 2014 |
| Generic and Orthogonal March Element based Memory BIST Engine H Kukner Master Thesis, Delft University of Technology, Netherlands, 2010 | 11 | 2010 |
| High performance hardware architectures for a hexagon-based motion estimation algorithm Ö Taşdizen, A Akın, HS Kükner, İ Hamzaoğlu, F Uğurdağ VLSI-SoC'08: IFIP/IEEE 16th International Conference on Very Large Scale …, 2008 | 11 | 2008 |
| BTI Reliability from Planar to FinFET nodes: Will the next node be more or less reliable? H Kukner, P Weckx, P Raghavan, B Kaczer, D Jang, F Catthoor, ... MEDIAN'14: 3rd Workshop on Manufacturable and Dependable Multicore …, 2014 | 10* | 2014 |
Pieter WeckxR&D Manager imecVerified email at imec.be
