Takip et
Shanshan Liu
Başlık
Alıntı yapanlar
Alıntı yapanlar
Yıl
Novel radiation-hardened-by-design (RHBD) 12T memory cell for aerospace applications in nanoscale CMOS technology
J Guo, L Zhu, W Liu, H Huang, S Liu, T Wang, L Xiao, Z Mao
IEEE Transactions on Very Large Scale Integration (VLSI) Systems 25 (5 …, 2017
792017
Soft error hardened memory design for nanoscale complementary metal oxide semiconductor technology
J Guo, L Xiao, T Wang, S Liu, X Wang, Z Mao
IEEE Transactions on Reliability 64 (2), 596-602, 2015
452015
An efficient single and double-adjacent error correcting parallel decoder for the (24, 12) extended golay code
P Reviriego, S Liu, L Xiao, JA Maestro
IEEE Transactions on Very Large Scale Integration (VLSI) Systems 24 (4 …, 2015
362015
Design and Evaluation of Low-Complexity Radiation Hardened CMOS Latch for Double-Node Upset Tolerance
J Guo, S Liu, L Zhu, F Lombardi
IEEE Transactions on Circuits and Systems I: Regular Papers, 2020
332020
A layout-based soft error vulnerability estimation approach for combinational circuits considering single event multiple transients (semts)
X Cao, L Xiao, J Li, R Zhang, S Liu, J Wang
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2018
332018
Low redundancy matrix-based codes for adjacent error correction with parity sharing
S Liu, L Xiao, J Li, Y Zhou, Z Mao
2017 18th International Symposium on Quality Electronic Design (ISQED), 76-80, 2017
222017
Result-Based Re-computation for Error-Tolerant Classification by a Support Vector Machine
S Liu, P Reviriego, X Tang, W Tang, F Lombardi
IEEE Transactions on Artificial Intelligence, 2020
192020
Detection of Limited Magnitude Errors in Emerging Multilevel Cell Memories by One-Bit Parity (OBP) or Two-Bit Parity (TBP)
S Liu, P Reviriego, F Lombardi
IEEE Transactions on Emerging Topics in Computing, 2019
182019
Extend orthogonal Latin square codes for 32-bit data protection in memory applications
S Liu, L Xiao, Z Mao
Microelectronics Reliability 63, 278-283, 2016
182016
A Double Error Correction Code for 32-Bit Data Words With Efficent Decoding
S Liu, J Li, P Reviriego, M Ottavi, L Xiao
IEEE Transactions on Device and Materials Reliability 18 (1), 125-127, 2018
162018
Single-event upset prediction in SRAMs account for on-transistor sensitive volume
W Tianqi, L Xiao, M Huo, B Zhou, Q Chunhua, L Shanshan, C Xuebing, ...
IEEE Transactions on Nuclear Science 62 (6), 3207-3215, 2015
162015
Stochastic Dividers for Low Latency Neural Networks
S Liu, X Tang, F Niknia, P Reviriego, W Liu, A Louri, F Lombardi
IEEE Transactions on Circuits and Systems I: Regular Papers, 2021
152021
Voting Margin: A Scheme for Error-Tolerant k Nearest Neighbors Classifiers for Machine Learning
S Liu, P Reviriego, JA Hernández, F Lombardi
IEEE Transactions on Emerging Topics in Computing, 2019
152019
Single event transient tolerant Bloom filter implementations
A Sánchez-Macián, P Reviriego, JA Maestro, S Liu
IEEE Transactions on Computers 66 (10), 1831-1836, 2017
142017
High-Performance CMOS Latch Designs for Recovering All Single and Double Node Upsets
J Guo, S Liu, X Su, C Qi, F Lombardi
IEEE Transactions on Aerospace and Electronic Systems, 2021
132021
Reduced Precision Redundancy for Reliable Processing of Data
S Liu, K Chen, P Reviriego, W Liu, A Louri, F Lombardi
IEEE Transactions on Emerging Topics in Computing, 2019
112019
A scheme to reduce the number of parity check bits in orthogonal Latin square codes
P Reviriego, S Liu, A Sánchez-Macián, L Xiao, JA Maestro
IEEE Transactions on Reliability 66 (2), 518-528, 2017
112017
Reducing the cost of triple adjacent error correction in double error correction orthogonal latin square codes
S Liu, P Reviriego, L Xiao, JA Maestro
IEEE Transactions on Device and Materials Reliability 16 (2), 269-271, 2016
102016
Error-Tolerant Computation for Voting Classifiers with Multiple Classes
S Liu, P Reviriego, P Montuschi, F Lombardi
IEEE Transactions on Vehicular Technology, 2020
92020
Evaluating Direct Compare for Double Error-Correction Codes
S Liu, P Reviriego, L Xiao
IEEE Transactions on Device and Materials Reliability 17 (4), 802-804, 2017
92017
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