didem erol
Title
Cited by
Cited by
Year
An Automated Setup for the Characterization of Time-Based Degradation Effects Including the Process Variability in 40 nm CMOS Transistors
X Xhafa, AD Güngördü, D Erol, Y Yavuz, MB Yelten
IEEE Transactions on Instrumentation and Measurement, 2021
2021
A switchable DC offset cancellation circuit for time-based degradation correction
D Erol, AD Güngördü, G Dündar, MB Yelten
Analog Integrated Circuits and Signal Processing 106 (3), 485-491, 2021
2021
An Offset Cancellation Set-up for Amplifiers Subject to Aging
D Erol, AD Güngördü, G Dündar, MB Yelten
2019 11th International Conference on Electrical and Electronics Engineering …, 2019
2019
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