| Scanning Hall probe microscopy (SHPM) using quartz crystal AFM feedback M Dede, K Ürkmen, Ö Giriþen, M Atabak, A Oral, I Farrer, D Ritchie Journal of Nanoscience and Nanotechnology 8 (2), 619-622, 2008 | 22 | 2008 |
| Measurement of energy dissipation between tungsten tip and Si (1 0 0)-(2× 1) using sub-Ångström oscillation amplitude non-contact atomic force microscope HÖ Özer, M Atabak, A Oral Applied Surface Science 210 (1-2), 12-17, 2003 | 14 | 2003 |
| Simultaneous non-contact atomic force microscopy (nc-AFM)/STM imaging and force spectroscopy of Si (1 0 0)(2× 1) with small oscillation amplitudes HÖ Özer, M Atabak, RM Ellialtýoðlu, A Oral Applied Surface Science 188 (3-4), 301-305, 2002 | 8 | 2002 |
| Simultaneous non-contact atomic force microscopy (nc-AFM)/STM imaging and force spectroscopy of Si (1 0 0)(2x1) with small oscillation amplitudes HO Ozer, M Atabak, RM Ellialtiogbrevelu, A Oral Applied Surface Science 188 (3), 301-305, 2002 | 7 | 2002 |
| Ultra-small oscillation amplitude nc-AFM/STM imaging, force and dissipation spectroscopy of Si (100)(2× 1) HÖ Özer, M Atabak, A Oral Solid state communications 124 (12), 469-472, 2002 | 4 | 2002 |
| Sub-Angstrom oscillation amplitude non-contact atomic force microscopy for lateral force gradient measurement M Atabak, Ö Ünverdi, HÖ Özer, A Oral Applied surface science 256 (5), 1299-1303, 2009 | 2 | 2009 |
| Noncontact lateral-force gradient measurement on surface with small-amplitude off-resonance atomic force microscopy M Atabak, Ö Ünverdi, HÖ Özer, A Oral Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 2009 | 2 | 2009 |
| Measurement of energy dissipation between tungsten tip and Si (1 0 0)-(2x1) using sub-Angstrom oscillation amplitude non-contact atomic force microscope H Ozgur Ozer, M Atabak, A Oral Applied Surface Science 210 (1), 12-17, 2003 | 1 | 2003 |
| Quantitative imaging of lateral stiffness using sub-ångstrom oscillation amplitude nc-AFM M Atabak, S Ozer, H Ozgur Ozer, A Oral APS March Meeting Abstracts, U38. 015, 2007 | | 2007 |
| Investigation of Lateral Forces in Dynamic Mode Using Combined AFM/STM M Atabak PQDT-Global, 2007 | | 2007 |
| Simultaneous lateral force and STM imaging of Si (111)-7x7 surface using sub-Angstrom oscillation amplitude AFM M Atabak, G Durkaya, HO Ozer, A Oral Bulletin of the American Physical Society, 2005 | | 2005 |
| Simultaneous nc-AFM/STM Imaging and Force Spectroscopy of Si (001)-(2x1) Surface with Small Oscillation Amplitudes H Ozgur Ozer, M Atabak, A Oral APS March Meeting Abstracts, G23. 008, 2002 | | 2002 |
| Simultaneous non-contact atomic force microscopy (nc-AFM) HO ÖZER, M ATABAK, RM ELLIALTIOGLU, A ORAL Applied surface science 188 (3-4), 301-305, 2002 | | 2002 |
| Simultaneous STM/AC-AFM investigation of clean Si (001)-(2x1) surface and Ge epitaxial growth on Si (001)-(2x1) M Atabak Mühendislik ve Fen Bilimleri Enstitüsü, 0 | | |
| Quantitative non-contact lateral force gradient and dissipation measurement using small oscillation amplitude lateral force combined with tunneling microscopy M Atabak, Ö Unverdi, S Özer, HÖ Özer, A Oral | | |
