Wenjing Rao
Alıntı yapanlar
Alıntı yapanlar
Test application time and volume compression through seed overlapping
W Rao, I Bayraktaroglu, A Orailoglu
Proceedings 2003. Design Automation Conference (IEEE Cat. No. 03CH37451 …, 2003
IC Piracy Prevention via Design Withholding and Entanglement
WR Soroush Khaleghi, Kai Da Zhao
Asia and South Pacific Design Automation Conference (ASP-DAC), pp. 821 - 826, 2015
Logic mapping in crossbar-based nanoarchitectures
W Rao, A Orailoglu, R Karri
IEEE Design & Test of Computers 26 (1), 68-77, 2009
Topology aware mapping of logic functions onto nanowire-based crossbar architectures
W Rao, A Orailoq, R Karri
2006 43rd ACM/IEEE Design Automation Conference, 723-726, 2006
Toward future systems with nanoscale devices: Overcoming the reliability challenge
W Rao, C Yang, R Karri, A Orailoglu
Computer 44 (2), 46-53, 2011
Logic level fault tolerance approaches targeting nanoelectronics plas
W Rao, A Orailoglu, R Karri
2007 Design, Automation & Test in Europe Conference & Exhibition, 1-5, 2007
Virtual compression through test vector stitching for scan based designs
W Rao, A Orailoglu
2003 Design, Automation and Test in Europe Conference and Exhibition, 104-109, 2003
Fault tolerant approaches to nanoelectronic programmable logic arrays
W Rao, A Orailoglu, R Karri
37th Annual IEEE/IFIP International Conference on Dependable Systems and …, 2007
Defect-tolerant logic mapping on nanoscale crossbar architectures and yield analysis
Y Su, W Rao
2009 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI …, 2009
Nanofabric topologies and reconfiguration algorithms to support dynamically adaptive fault tolerance
W Rao, A Orailoglu, R Karri
24th IEEE VLSI Test Symposium, 6 pp.-221, 2006
Fault tolerant arithmetic with applications in nanotechnology based systems
W Rao, A Orailoglu, R Karri
2004 International Conferce on Test, 472-478, 2004
Selective hardening of nanopla circuits
I Polian, W Rao
2008 IEEE International Symposium on Defect and Fault Tolerance of VLSI …, 2008
Fault tolerant nanoelectronic processor architectures
W Rao, A Orailoglu, R Karri
Proceedings of the ASP-DAC 2005. Asia and South Pacific Design Automation …, 2005
Fault identification in reconfigurable carry lookahead adders targeting nanoelectronic fabrics
W Rao, A Orailoglu, R Karri
Eleventh IEEE European Test Symposium (ETS'06), 63-68, 2006
Frugal linear network-based test decompression for drastic test cost reductions
W Rao, A Orailoglu, G Su
IEEE/ACM International Conference on Computer Aided Design, 2004. ICCAD-2004 …, 2004
Hardware obfuscation using strong pufs
S Khaleghi, W Rao
2018 IEEE Computer Society Annual Symposium on VLSI (ISVLSI), 321-326, 2018
An integrated framework toward defect-tolerant logic implementation onto nanocrossbars
Y Su, W Rao
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2013
Towards fault tolerant parallel prefix adders in nanoelectronic systems
W Rao, A Orailoglu
2008 Design, Automation and Test in Europe, 360-365, 2008
Architectural-level fault tolerant computation in nanoelectronic processors
W Rao, A Orailoglu, R Karri
2005 International Conference on Computer Design, 533-539, 2005
Towards nanoelectronics processor architectures
W Rao, A Orailoglu, R Karri
Journal of Electronic Testing 23 (2), 235-254, 2007
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Makaleler 1–20