| Unified capture scheme for small delay defect detection and aging prediction S Jin, Y Han, H Li, X Li IEEE transactions on very large scale integration (VLSI) systems 21 (5), 821-833, 2012 | 21 | 2012 |
| Statistical lifetime reliability optimization considering joint effect of process variation and aging S Jin, Y Han, H Li, X Li Integration 44 (3), 185-191, 2011 | 21 | 2011 |
| M-IVC: Using multiple input vectors to minimize aging-induced delay S Jin, Y Han, L Zhang, H Li, X Li, G Yan 2009 Asian Test Symposium, 437-442, 2009 | 13 | 2009 |
| M-IVC: Applying multiple input vectors to co-optimize aging and leakage S Jin, Y Han Microelectronics Journal 43 (11), 838-847, 2012 | 9 | 2012 |
| P^(2) CLRAF: An Pre-and Post-Silicon Cooperated Circuit Lifetime Reliability Analysis Framework S Jin, Y Han, H Li, X Li 2010 19th IEEE Asian Test Symposium, 117-120, 2010 | 8 | 2010 |
