Takip et
Jae Wook Lee
Jae Wook Lee
Product Development Engineer, Intel Corporation
intel.com üzerinde doğrulanmış e-posta adresine sahip
Başlık
Alıntı yapanlar
Alıntı yapanlar
Yıl
Analysis of dynamic voltage drop with PVT variation in FinFET designs
Y Ban, C Choi, H Shin, J Lee, Y Kang, W Paik
SoC Design Conference (ISOCC), 2014 International, 132-133, 2014
72014
At-speed Test of High-Speed DUT Using Built-Off Test Interface
J Park, JW Lee, J Chung, K Han, J Abraham, E Byun, CJ Woo, S Oh
Test Symposium (ATS), 2010 19th IEEE Asian, 269-274, 2010
72010
A random jitter RMS estimation technique for BIST applications
JW Lee, JHP Chun, J Abraham
Asian Test Symposium, 2009. ATS'09., 9-14, 2009
62009
A novel characterization technique for high speed I/O mixed signal circuit components using random jitter injection
JHP Chun, JW Lee, JA Abraham
Proceedings of the 2010 Asia and South Pacific Design Automation Conference …, 2010
52010
Construction of largest equivalent systems for power system simulator
YH Kim, ST Cha, JW Lee, TK Kim, JB Choo, HK Nam
European transactions on electrical power 16 (1), 79-91, 2006
52006
An Analytical Approach to Thermal Design and Optimization With a Temperature-Dependent Power Model
S Shim, JW Lee, Y Shin
Circuits and Systems I: Regular Papers, IEEE Transactions on 62 (3), 816-824, 2015
22015
Off-Chip Skew Measurement and Compensation Module (SMCM) Design for Built-Off Test Chip
K Han, J Park, JW Lee, J Chung, E Byun, CJ Woo, S Oh, JA Abraham
Journal of Electronic Testing 27 (4), 429-439, 2011
22011
A delay measurement method using a shrinking clock signal
JW Lee, JH Chun, JA Abraham
Proceedings of the 20th symposium on Great lakes symposium on VLSI, 139-142, 2010
22010
Low-Complexity Off-Chip Skew Measurement and Compensation Module (SMCM) Design for Built-Off Test Chip
K Han, J Park, JW Lee, J Abraham, E Byun, CJ Woo, S Oh
Test Symposium, 2009 14th IEEE European, 129-134, 2009
22009
Development of wide area monitoring system using GPS
JB Choo, KH Kim, DH Jeon, JW Lee, IK Lee, SH Yoon
Preprints IFAC Symp. Power Plants and Power Systems Control, Seoul, Korea …, 2003
22003
Indirect method for random jitter measurement on SoCs using critical path characterization
JW Lee, JH Chun, JA Abraham
Test Symposium (ETS), 2012 17th IEEE European, 1-6, 2012
12012
Test of phase interpolators in high speed I/Os using a sliding window search
JH Chun, SM Lim, SC Ong, JW Lee, J Abraham
VLSI Test Symposium (VTS), 2012 IEEE 30th, 134-139, 2012
2012
Sistem, işlemi şu anda gerçekleştiremiyor. Daha sonra yeniden deneyin.
Makaleler 1–12