Takip et
Manuel J. Barragan
Manuel J. Barragan
CNRS - TIMA Laboratory
univ-grenoble-alpes.fr üzerinde doğrulanmış e-posta adresine sahip
Başlık
Alıntı yapanlar
Alıntı yapanlar
Yıl
Efficient selection of signatures for analog/RF alternate test
MJ Barragan, G Leger
2013 18th IEEE European Test Symposium (ETS), 1-6, 2013
482013
IC testing methods and apparatus
A Zjajo, MJB Asian, JJP De Gyvez
US Patent 8,310,265, 2012
452012
Alternate test of LNAs through ensemble learning of on-chip digital envelope signatures
MJ Barragán, R Fiorelli, G Leger, A Rueda, JL Huertas
Journal of Electronic Testing 27, 277-288, 2011
442011
A procedure for alternate test feature design and selection
MJ Barragan, G Leger
IEEE Design & Test 32 (1), 18-25, 2014
382014
BIST method for die-level process parameter variation monitoring in analog/mixed-signal integrated circuits
A Zjajo, MJB Asian, JP de Gyvez
2007 Design, Automation & Test in Europe Conference & Exhibition, 1-6, 2007
382007
On-chip sinusoidal signal generation with harmonic cancelation for analog and mixed-signal BIST applications
MJ Barragan, G Leger, D Vazquez, A Rueda
Analog Integrated Circuits and Signal Processing 82, 67-79, 2015
362015
A Fully-Digital BIST Wrapper Based on Ternary Test Stimuli for the Dynamic Test of a 40 nm CMOS 18-bit Stereo Audio ADC
MJ Barragan, R Alhakim, HG Stratigopoulos, M Dubois, S Mir, H Le Gall, ...
IEEE Transactions on Circuits and Systems I: Regular Papers 63 (11), 1876-1888, 2016
282016
Design of a 77-GHz LC-VCO With a Slow-Wave Coplanar Stripline-Based Inductor
E Sharma, AA Saadi, M Margalef-Rovira, E Pistono, MJ Barragan, ...
IEEE Transactions on Circuits and Systems I: Regular Papers 67 (2), 378-388, 2019
242019
A 65nm CMOS ramp generator design and its application towards a BIST implementation of the reduced-code static linearity test technique for pipeline ADCs
G Renaud, MJ Barragan, A Laraba, HG Stratigopoulos, S Mir, H Le-Gall, ...
Journal of Electronic Testing 32, 407-421, 2016
232016
Practical simulation flow for evaluating analog/mixed-signal test techniques
MJ Barragan, HG Stratigopoulos, S Mir, H Le-Gall, N Bhargava, A Bal
IEEE Design & Test 33 (6), 46-54, 2016
232016
Improving the accuracy of RF alternate test using multi-VDD conditions: application to envelope-based test of LNAs
MJ Barragan, R Fiorelli, G Leger, A Rueda, JL Huertas
2011 Asian Test Symposium, 359-364, 2011
232011
Brownian distance correlation-directed search: A fast feature selection technique for alternate test
G Leger, MJ Barragan
Integration 55, 401-414, 2016
222016
Design trade-offs for on-chip driving of high-speed high-performance ADCs in static BIST applications
AJ Gines, E Peralias, G Leger, A Rueda, G Renaud, MJ Barragan, S Mir
2016 IEEE 21st International Mixed-Signal Testing Workshop (IMSTW), 1-6, 2016
212016
On-chip analog sinewave generator with reduced circuitry resources
MJ Barragan, D Vazquez, A Rueda, JL Huertas
2006 49th IEEE International Midwest Symposium on Circuits and Systems 2 …, 2006
212006
Analog sinewave signal generators for mixed-signal built-in test applications
MJ Barragán, D Vázquez, A Rueda
Journal of Electronic Testing 27, 305-320, 2011
202011
On-chip characterisation of RF systems based on envelope response analysis
MJ Barragán, R Fiorelli, D Vázquez, A Rueda, JL Huertas
Electronics Letters 46 (1), 36-38, 2010
202010
Design of mm-wave slow-wave-coupled coplanar waveguides
M Margalef-Rovira, J Lugo-Alvarez, A Bautista, L Vincent, S Lepilliet, ...
IEEE Transactions on Microwave Theory and Techniques 68 (12), 5014-5028, 2020
182020
Fully differential 4-V output range 14.5-ENOB stepwise ramp stimulus generator for on-chip static linearity test of ADCs
G Renaud, M Diallo, MJ Barragan, S Mir
IEEE Transactions on Very Large Scale Integration (VLSI) Systems 27 (2), 281-293, 2018
182018
Mostly-digital design of sinusoidal signal generators for mixed-signal BIST applications using harmonic cancellation
H Malloug, MJ Barragan, S Mir, E Simeu, H Le-Gall
2016 IEEE 21st International Mixed-Signal Testing Workshop (IMSTW), 1-6, 2016
172016
Sine-wave signal characterization using square-wave and ΣΔ-modulation: application to mixed-signal BIST
D Vázquez, G Huertas, Á Luque, MJ Barragán, G Leger, A Rueda, ...
Journal of Electronic Testing 21, 221-232, 2005
172005
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