Xianghai Meng

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	Hepsi	2019 yılından bugüne
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h-endeksi	12	11
i10-endeksi	12	11

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Katkıda bulunan yazarlar

Yaguo WangUniversity of Texas at Austinaustin.utexas.edu üzerinde doğrulanmış e-posta adresine sahip
Feng HeHarbin Institute of Technology-Shenzhenhit.edu.cn üzerinde doğrulanmış e-posta adresine sahip
Ke ChenPostdoctoral Associate, MITmit.edu üzerinde doğrulanmış e-posta adresine sahip
Jung-Fu LinJackson School of Geosciences, University of Texas at Austinjsg.utexas.edu üzerinde doğrulanmış e-posta adresine sahip
Yongjian ZhouTHE UNIVERSITY OF TEXAS AT AUSTINutexas.edu üzerinde doğrulanmış e-posta adresine sahip
Abhishek SinghProfessor of Materials Research Centre, IISc Bangaloreiisc.ac.in üzerinde doğrulanmış e-posta adresine sahip
Akash SinghAssistant Professor at Indian Institute of Technology, Patnaiitp.ac.in üzerinde doğrulanmış e-posta adresine sahip
Rinkle JunejaOak Ridge National Laboratoryornl.gov üzerinde doğrulanmış e-posta adresine sahip
Tribhuwan PandeyDepartment of Physics, University of Antwerpuantwerpen.be üzerinde doğrulanmış e-posta adresine sahip
Richard H. RobertsGraduate Student, The University of Texas at Austinutexas.edu üzerinde doğrulanmış e-posta adresine sahip
Li ShiUniversity of Texas at Austinmail.utexas.edu üzerinde doğrulanmış e-posta adresine sahip

Takip et

Xianghai Meng

Intel Corporation, The University of Texas at Austin, Stony Brook University

intel.com üzerinde doğrulanmış e-posta adresine sahip

semiconductors optics physics heat transfer


Başlık Alıntılara göre sırala Yıla göre sırala Başlığa göre sırala	Alıntı yapanlar Alıntı yapanlar	Yıl
Moiré patterns in 2D materials: A review F He, Y Zhou, Z Ye, SH Cho, J Jeong, X Meng, Y Wang ACS nano 15 (4), 5944-5958, 2021	155	2021
Thermal Conductivity Enhancement in under Extreme Strain X Meng, T Pandey, J Jeong, S Fu, J Yang, K Chen, A Singh, F He, X Xu, ... Physical Review Letters 122 (15), 155901, 2019	91	2019
Experimental evidence of exciton capture by mid-gap defects in CVD grown monolayer MoSe 2 K Chen, R Ghosh, X Meng, A Roy, JS Kim, F He, SC Mason, X Xu, JF Lin, ... npj 2D Materials and Applications 1 (1), 15, 2017	59	2017
Stacking‐Order‐Driven Optical Properties and Carrier Dynamics in ReS₂ Y Zhou, N Maity, A Rai, R Juneja, X Meng, A Roy, Y Zhang, X Xu, JF Lin, ... Advanced Materials 32 (22), 1908311, 2020	48	2020
Anisotropic Saturable and Excited‐State Absorption in Bulk ReS₂ X Meng, Y Zhou, K Chen, RH Roberts, W Wu, JF Lin, RT Chen, X Xu, ... Advanced Optical Materials 6 (14), 1800137, 2018	45	2018
Carrier trapping by oxygen impurities in molybdenum diselenide K Chen, A Roy, A Rai, A Valsaraj, X Meng, F He, X Xu, LF Register, ... ACS applied materials & interfaces 10 (1), 1125-1131, 2017	42	2017
Accelerated carrier recombination by grain boundary/edge defects in MBE grown transition metal dichalcogenides K Chen, A Roy, A Rai, HCP Movva, X Meng, F He, SK Banerjee, Y Wang APL Materials 6 (5), 056103, 2018	34	2018
Non-destructive measurement of photoexcited carrier transport in graphene with ultrafast grating imaging technique K Chen, MN Yogeesh, Y Huang, S Zhang, F He, X Meng, S Fang, ... Carbon 107, 233-239, 2016	24	2016
Pressure‐Dependent Behavior of Defect‐Modulated Band Structure in Boron Arsenide X Meng, A Singh, R Juneja, Y Zhang, F Tian, Z Ren, AK Singh, L Shi, ... Advanced Materials, 2001942, 2020	23	2020
Picosecond transient thermoreflectance for thermal conductivity characterization J Jeong, X Meng, AK Rockwell, SR Bank, WP Hsieh, JF Lin, Y Wang Nanoscale and Microscale Thermophysical Engineering, 1-11, 2019	17	2019
Measurement of ambipolar diffusion coefficient of photoexcited carriers with ultrafast reflective grating-imaging technique K Chen, N Sheehan, F He, X Meng, SC Mason, SR Bank, Y Wang ACS Photonics 4 (6), 1440-1446, 2017	16	2017
Carrier dynamics and optical nonlinearity of alloyed CdSeTe quantum dots in glass matrix W Wu, Z Chai, Y Gao, D Kong, F He, X Meng, Y Wang Optical Materials Express 7 (5), 1547-1556, 2017	15	2017
Comparison between grating imaging and transient grating techniques on measuring carrier diffusion in semiconductor K Chen, X Meng, F He, Y Zhou, J Jeong, N Sheehan, SR Bank, Y Wang Nanoscale and Microscale Thermophysical Engineering 22 (4), 348-359, 2018	3	2018

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