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Marko Vauhkonen
Marko Vauhkonen
Department of Applied Physics, University of Eastern Finland
Verified email at uef.fi
Title
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Cited by
Year
Tikhonov regularization and prior information in electrical impedance tomography
M Vauhkonen, D Vadász, PA Karjalainen, E Somersalo, JP Kaipio
IEEE transactions on medical imaging 17 (2), 285-293, 1998
6931998
Three-dimensional electrical impedance tomography based on the complete electrode model
PJ Vauhkonen, M Vauhkonen, T Savolainen, JP Kaipio
IEEE Transactions on Biomedical Engineering 46 (9), 1150-1160, 1999
4371999
Statistical inversion and Monte Carlo sampling methods in electrical impedance tomography
JP Kaipio, V Kolehmainen, E Somersalo, M Vauhkonen
Inverse problems 16 (5), 1487, 2000
4352000
Electrical impedance tomography and prior information
M Vauhkonen
PhD thesis, Kuopio University, Kuopio, 1997
4161997
A MATLAB package for the EIDORS project to reconstruct two-dimensional EIT images
M Vauhkonen, WRB Lionheart, LM Heikkinen, PJ Vauhkonen, JP Kaipio
Physiological measurement 22 (1), 107, 2001
3352001
Inverse problems with structural prior information
JP Kaipio, V Kolehmainen, M Vauhkonen, E Somersalo
Inverse problems 15 (3), 713, 1999
3041999
Approximation errors and model reduction with an application in optical diffusion tomography
SR Arridge, JP Kaipio, V Kolehmainen, M Schweiger, E Somersalo, ...
Inverse problems 22 (1), 175, 2006
2782006
A Kalman filter approach to track fast impedance changes in electrical impedance tomography
M Vauhkonen, PA Karjalainen, JP Kaipio
IEEE transactions on biomedical engineering 45 (4), 486-493, 1998
2471998
Assessment of errors in static electrical impedance tomography with adjacent and trigonometric current patterns
V Kolehmainen, M Vauhkonen, PA Karjalainen, JP Kaipio
Physiological measurement 18 (4), 289, 1997
1781997
Recovery of region boundaries of piecewise constant coefficients of an elliptic PDE from boundary data
V Kolehmainen, SR Arridge, WRB Lionheart, M Vauhkonen, JP Kaipio
Inverse Problems 15 (5), 1375, 1999
1541999
State estimation with fluid dynamical evolution models in process tomography-an application to impedance tomography
A Seppänen, M Vauhkonen, PJ Vauhkonen, E Somersalo, JP Kaipio
Inverse Problems 17 (3), 467, 2001
1482001
Coupled radiative transfer equation and diffusion approximation model for photon migration in turbid medium with low-scattering and non-scattering regions
T Tarvainen, M Vauhkonen, V Kolehmainen, SR Arridge, JP Kaipio
Physics in Medicine & Biology 50 (20), 4913, 2005
1452005
Simultaneous reconstruction of electrode contact impedances and internal electrical properties: I. Theory
T Vilhunen, JP Kaipio, PJ Vauhkonen, T Savolainen, M Vauhkonen
Measurement Science and Technology 13 (12), 1848, 2002
1372002
Electrical impedance tomography with basis constraints
M Vauhkonen, JP Kaipio, E Somersalo, PA Karjalainen
Inverse problems 13 (2), 523, 1997
1361997
Image reconstruction in time-varying electrical impedance tomography based on the extended Kalman filter
KY Kim, BS Kim, MC Kim, YJ Lee, M Vauhkonen
Measurement Science and Technology 12 (8), 1032, 2001
1212001
Simultaneous reconstruction of electrode contact impedances and internal electrical properties: II. Laboratory experiments
LM Heikkinen, T Vilhunen, RM West, M Vauhkonen
Measurement Science and Technology 13 (12), 1855, 2002
1192002
Subspace regularization method for the single-trial estimation of evoked potentials
PA Karjalainen, JP Kaipio, AS Koistinen, M Vauhkonen
IEEE Transactions on Biomedical Engineering 46 (7), 849-860, 1999
1161999
Hybrid radiative-transfer–diffusion model for optical tomography
T Tarvainen, M Vauhkonen, V Kolehmainen, JP Kaipio
Applied optics 44 (6), 876-886, 2005
1152005
Suitability of a PXI platform for an electrical impedance tomography system
J Kourunen, T Savolainen, A Lehikoinen, M Vauhkonen, LM Heikkinen
Measurement Science and Technology 20 (1), 015503, 2008
1112008
Effects of local skull inhomogeneities on EEG source estimation
JO Ollikainen, M Vauhkonen, PA Karjalainen, JP Kaipio
Medical engineering & physics 21 (3), 143-154, 1999
1031999
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