Terje Finstad
Terje Finstad
Department of Physics, University of Oslo
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Phase stability, electronic structure, and optical properties of indium oxide polytypes
SZ Karazhanov, P Ravindran, P Vajeeston, A Ulyashin, TG Finstad, ...
Physical Review B—Condensed Matter and Materials Physics 76 (7), 075129, 2007
Transient enhanced diffusion during rapid thermal annealing of boron implanted silicon
K Cho, M Numan, TG Finstad, WK Chu, J Liu, JJ Wortman
Applied physics letters 47 (12), 1321-1323, 1985
Lattice-matched Sc1−xErxAs/GaAs heterostructures: A demonstration of new systems for fabricating lattice-matched metallic compounds to semiconductors
CJ Palmstro
Applied physics letters 56 (4), 382-384, 1990
A Xe marker study of the transformation of Ni2Si to NiSi in thin films
TG Finstad
Physica status solidi (a) 63 (1), 223-228, 1981
Doping of p‐type ZnSb: Single parabolic band model and impurity band conduction
PHM Böttger, GS Pomrehn, GJ Snyder, TG Finstad
physica status solidi (a) 208 (12), 2753-2759, 2011
Channeling effect for low energy ion implantation in Si
K Cho, WR Allen, TG Finstad, WK Chu, J Liu, JJ Wortman
Nuclear Instruments and Methods in Physics Research Section B: Beam …, 1985
Reaction of silicon with films of Co Ni alloys: Phase separation of the monosilicides and nucleation of the disilicides
FM d'Heurle, DD Anfiteatro, VR Deline, TG Finstad
Thin Solid Films 128 (1-2), 107-124, 1985
Etch rates of (100),(111) and (110) single-crystal silicon in TMAH measured in situ by laser reflectance interferometry
E Steinsland, T Finstad, A Hanneborg
Sensors and Actuators A: Physical 86 (1-2), 73-80, 2000
The role of grain boundary scattering in reducing the thermal conductivity of polycrystalline XNiSn (X = Hf, Zr, Ti) half-Heusler alloys
M Schrade, K Berland, SNH Eliassen, MN Guzik, C Echevarria-Bonet, ...
Scientific reports 7 (1), 13760, 2017
AlAl thermocompression bonding for wafer-level MEMS sealing
N Malik, K Schjølberg-Henriksen, E Poppe, MMV Taklo, TG Finstad
Sensors and Actuators A: Physical 211, 115-120, 2014
Characterization of Ge nanocrystals embedded in SiO2 by Raman spectroscopy
U Serincan, G Kartopu, A Guennes, TG Finstad, R Turan, Y Ekinci, ...
Semiconductor science and technology 19 (2), 247, 2003
Design and construction of a four-point bending based set-up for measurement of piezoresistance in semiconductors
E Lund, TG Finstad
Review of scientific instruments 75 (11), 4960-4966, 2004
Thermoelectric properties of Cu doped ZnSb containing Zn3P2 particles
K Valset, PHM Böttger, J Taftø, TG Finstad
Journal of Applied Physics 111 (2), 2012
Measurement of thin film thermal conductivity using the laser flash method
M Ruoho, K Valset, T Finstad, I Tittonen
Nanotechnology 26 (19), 195706, 2015
Structural study of GaSb/AlSb strained-layer superlattice
CK Pan, DC Zheng, TG Finstad, WK Chu, VS Speriosu, MA Nicolet, ...
Physical Review B 31 (3), 1270, 1985
Silicide formation with nickel and platinum double layers on silicon
TG Finstad
Thin Solid Films 51 (3), 411-424, 1978
Electronic Transport Properties of [Ca2CoO3−δ]q[CoO2]
M Schrade, H Fjeld, TG Finstad, T Norby
The Journal of Physical Chemistry C 118 (6), 2908-2918, 2014
Self‐Aligned Ti Silicide Formed by Rapid Thermal Annealing
T Brat, CM Osburn, T Finstad, J Liu, B Ellington
Journal of the Electrochemical Society 133 (7), 1451, 1986
High temperature transport properties of thermoelectric CaMnO3− δ—Indication of strongly interacting small polarons
M Schrade, R Kabir, S Li, T Norby, TG Finstad
Journal of Applied Physics 115 (10), 2014
The formation of disilicides from bilayers of Ni/Co and Co/Ni on silicon: Phase separation and solid solution
TG Finstad, DD Anfiteatro, VR Deline, FM d'Heurle, P Gas, VL Moruzzi, ...
Thin Solid Films 135 (2), 229-243, 1986
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