Barry P. Linder
Barry P. Linder
Research Staff Member, IBM
Verified email at us.ibm.com
Title
Cited by
Cited by
Year
Dielectric breakdown mechanisms in gate oxides
S Lombardo, JH Stathis, BP Linder, KL Pey, F Palumbo, CH Tung
Journal of applied physics 98 (12), 12, 2005
4142005
The impact of gate-oxide breakdown on SRAM stability
R Rodriguez, JH Stathis, BP Linder, S Kowalczyk, CT Chuang, RV Joshi, ...
IEEE Electron Device Letters 23 (9), 559-561, 2002
1332002
Examination of flatband and threshold voltage tuning of field effect transistors by dielectric cap layers
S Guha, VK Paruchuri, M Copel, V Narayanan, YY Wang, PE Batson, ...
Applied Physics Letters 90 (9), 092902, 2007
1142007
Role of oxygen vacancies in V/sub FB//V/sub t/stability of pFET metals on HfO/sub 2
E Cartier, FR McFeely, V Narayanan, P Jamison, BP Linder, M Copel, ...
Digest of Technical Papers. 2005 Symposium on VLSI Technology, 2005., 230-231, 2005
1142005
Voltage dependence of hard breakdown growth and the reliability implication in thin dielectrics
BP Linder, S Lombardo, JH Stathis, A Vayshenker, DJ Frank
IEEE Electron Device Letters 23 (11), 661-663, 2002
1132002
High performance 14nm SOI FinFET CMOS technology with 0.0174m2embedded DRAM and 15 levels of Cu metallization
CH Lin, B Greene, S Narasimha, J Cai, A Bryant, C Radens, V Narayanan, ...
2014 IEEE International Electron Devices Meeting, 3.8. 1-3.8. 3, 2014
1102014
Metal gate CMOS with at least a single gate metal and dual gate dielectrics
BB Doris, YH Kim, BP Linder, V Narayanan, VK Paruchuri
US Patent 7,432,567, 2008
1102008
Fundamental aspects of HfO2-based high-k metal gate stack reliability and implications on tinv-scaling
E Cartier, A Kerber, T Ando, MM Frank, K Choi, S Krishnan, B Linder, ...
2011 International Electron Devices Meeting, 18.4. 1-18.4. 4, 2011
1022011
High-performance high-κ/metal gates for 45nm CMOS and beyond with gate-first processing
M Chudzik, B Doris, R Mo, J Sleight, E Cartier, C Dewan, D Park, H Bu, ...
2007 IEEE Symposium on VLSI Technology, 194-195, 2007
1012007
A model for gate-oxide breakdown in CMOS inverters
R Rodriguez, JH Stathis, BP Linder
IEEE Electron Device Letters 24 (2), 114-116, 2003
982003
High performance CMOS circuits, and methods for fabricating the same
J Arnold, G Biery, A Callegari, TC Chen, M Chudzik, B Doris, M Gribelyuk, ...
US Patent App. 11/323,578, 2007
972007
Band-edge high-performance high-k/metal gate n-MOSFETs using cap layers containing group IIA and IIIB elements with gate-first processing for 45 nm and beyond
TC Chen, G Shahidi, S Guha, M Ieong, MP Chudzik, R Jammy, ...
2006 Symposium on VLSI Technology, 2006. Digest of Technical Papers., 178-179, 2006
952006
Fundamental understanding and optimization of PBTI in nFETs with SiO2/HfO2 gate stack
E Cartier, BP Linder, V Narayanan, VK Paruchuri
2006 International Electron Devices Meeting, 1-4, 2006
902006
22nm High-performance SOI technology featuring dual-embedded stressors, Epi-Plate High-K deep-trench embedded DRAM and self-aligned Via 15LM BEOL
S Narasimha, P Chang, C Ortolland, D Fried, E Engbrecht, K Nummy, ...
2012 International Electron Devices Meeting, 3.3. 1-3.3. 4, 2012
832012
Gate oxide breakdown under current limited constant voltage stress
BP Linder, JH Stathis, RA Wachnik, E Wu, SA Cohen, A Ray, ...
2000 Symposium on VLSI Technology. Digest of Technical Papers (Cat. No…, 2000
832000
Structures and techniques for atomic layer deposition
S Aoyama, RD Clark, SP Consiglio, M Hopstaken, H Jagannathan, ...
US Patent 8,722,548, 2014
662014
Growth and scaling of oxide conduction after breakdown
BP Linder, JH Stathis, DJ Frank, S Lombardo, A Vayshenker
2003 IEEE International Reliability Physics Symposium Proceedings, 2003…, 2003
642003
Modeling and experimental verification of the effect of gate oxide breakdown on CMOS inverters
R Rodriguez, JH Stathis, BP Linder
2003 IEEE International Reliability Physics Symposium Proceedings, 2003…, 2003
562003
Extremely scaled gate-first high-k/metal gate stack with EOT of 0.55 nm using novel interfacial layer scavenging techniques for 22nm technology node and beyond
K Choi, H Jagannathan, C Choi, L Edge, T Ando, M Frank, P Jamison, ...
2009 Symposium on VLSI Technology, 138-139, 2009
552009
Breakdown transients in ultrathin gate oxides: Transition in the degradation rate
S Lombardo, JH Stathis, BP Linder
Physical review letters 90 (16), 167601, 2003
542003
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