Xrysovalantis Kavousianos
Xrysovalantis Kavousianos
cs.uoi.gr üzerinde doğrulanmış e-posta adresine sahip - Ana Sayfa
Başlık
Alıntı yapanlar
Alıntı yapanlar
Yıl
Optimal selective Huffman coding for test-data compression
X Kavousianos, E Kalligeros, D Nikolos
IEEE transactions on computers 56 (8), 1146-1152, 2007
1612007
Multilevel Huffman coding: An efficient test-data compression method for IP cores
X Kavousianos, E Kalligeros, D Nikolos
IEEE transactions on computer-aided design of integrated circuits and …, 2007
612007
Multilevel-Huffman test-data compression for IP cores with multiple scan chains
X Kavousianos, E Kalligeros, D Nikolos
IEEE Transactions on Very Large Scale Integration (VLSI) Systems 16 (7), 926-931, 2008
482008
Test data compression based on variable-to-variable Huffman encoding with codeword reusability
X Kavousianos, E Kalligeros, D Nikolos
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2008
482008
Multiphase BIST: A new reseeding technique for high test-data compression
E Kalligeros, X Kavousianos, D Nikolos
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2004
332004
Test schedule optimization for multicore SoCs: Handling dynamic voltage scaling and multiple voltage islands
X Kavousianos, K Chakrabarty, A Jain, R Parekhji
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2012
322012
An efficient seeds selection method for LFSR-based test-per-clock BIST
E Kalligeros, X Kavousianos, D Bakalis, D Nikolos
Proceedings International Symposium on Quality Electronic Design, 261-266, 2002
292002
Efficient partial scan cell gating for low-power scan-based testing
X Kavousianos, D Bakalis, D Nikolos
ACM Transactions on Design Automation of Electronic Systems (TODAES) 14 (2 …, 2009
262009
State skip LFSRs: Bridging the gap between test data compression and test set embedding for IP cores
V Tenentes, X Kavousianos, E Kalligeros
2008 Design, Automation and Test in Europe, 474-479, 2008
252008
Reseeding-based test set embedding with reduced test sequences
E Kalligeros, D Kaseridis, X Kavousianos, D Nikolos
Sixth international symposium on quality electronic design (isqed'05), 226-231, 2005
252005
On-the-fly reseeding: A new reseeding technique for test-per-clock BIST
E Kalligeros, X Kavousianos, D Bakalis, D Nikolos
Journal of Electronic Testing 18 (3), 315-332, 2002
252002
On the design of self-testing checkers for modified Berger codes
SJ Piestrak, D Bakalis, X Kavousianos
Proceedings Seventh International On-Line Testing Workshop, 153-157, 2001
242001
Single and variable-state-skip LFSRs: bridging the gap between test data compression and test set embedding for IP cores
V Tenentes, X Kavousianos, E Kalligeros
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2010
232010
Defect aware x-filling for low-power scan testing
S Balatsouka, V Tenentes, X Kavousianos, K Chakrabarty
2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010 …, 2010
232010
Novel TSC Checkers for Bose-Lin and Bose Codes
X Kavousianos, D Nikolos
Proceedings of the 3ed IEEE International On-Line Testing Workshop, July, 6-8, 1998
231998
Static power reduction using variation-tolerant and reconfigurable multi-mode power switches
Z Zhang, X Kavousianos, K Chakrabarty, Y Tsiatouhas
IEEE Transactions on Very Large Scale Integration (VLSI) Systems 22 (1), 13-26, 2013
212013
The time dilation technique for timing error tolerance
S Valadimas, A Floros, Y Tsiatouhas, A Arapoyanni, X Kavousianos
IEEE Transactions on Computers 63 (5), 1277-1286, 2012
212012
New reseeding technique for LFSR-based test pattern generation
E Kalligeros, X Kavousianos, D Bakalis, D Nikolos
Proceedings Seventh International On-Line Testing Workshop, 80-86, 2001
212001
Novel single and double output TSC Berger code checkers
X Kavousianos, D Nikolos
Proceedings. 16th IEEE VLSI Test Symposium (Cat. No. 98TB100231), 348-353, 1998
211998
Test scheduling for multicore SoCs with dynamic voltage scaling and multiple voltage islands
X Kavousianos, K Chakrabarty, A Jain, R Parekhji
2011 Asian Test Symposium, 33-39, 2011
202011
Sistem, işlemi şu anda gerçekleştiremiyor. Daha sonra yeniden deneyin.
Makaleler 1–20