| Applying Vstress and defect activation coverage to produce zero-defect mixed-signal automotive ICs W Dobbelaere, F Colle, A Coyette, R Vanhooren, N Xama, J Gomez, ... 2019 IEEE International Test Conference (ITC), 1-4, 2019 | 14 | 2019 |
| 0.3 V supply, 17 ppm/° C 3-transistor picowatt voltage reference AC de Oliveira, JG Caicedo, HD Klimach, S Bampi 2016 IEEE 7th Latin American Symposium on Circuits & Systems (LASCAS), 263-266, 2016 | 11 | 2016 |
| High PSRR nano-watt MOS-only threshold voltage monitor circuit CJA Gomez, H Klimach, E Fabris, OE Mattia 2015 28th Symposium on Integrated Circuits and Systems Design (SBCCI), 1-6, 2015 | 10 | 2015 |
| Recent trends and perspectives on defect-oriented testing P Bernardi, R Cantoro, A Coyette, W Dobbeleare, M Fieback, A Floridia, ... 2022 IEEE 28th International Symposium on On-Line Testing and Robust System …, 2022 | 7 | 2022 |
| Pinhole latent defect modeling and simulation for defect-oriented analog/mixed-signal testing J Gomez, N Xama, A Coyette, R Vanhooren, W Dobbelaere, G Gielen 2020 IEEE 38th VLSI Test Symposium (VTS), 1-6, 2020 | 7 | 2020 |
| 0.75 V supply nanowatt resistorless sub-bandgap curvature-compensated CMOS voltage reference JA Gomez Caicedo, OE Mattia, H Klimach, S Bampi Analog Integrated Circuits and Signal Processing 88, 333-345, 2016 | 7 | 2016 |
| 1.5 ppm/° C nano-Watt resistorless MOS-only voltage reference CJA Gomez, H Klimach, E Fabris, S Bampi 2016 IEEE 7th Latin American Symposium on Circuits & Systems (LASCAS), 99-102, 2016 | 6 | 2016 |
| Machine learning-based defect coverage boosting of analog circuits under measurement variations N Xama, M Andraud, J Gomez, B Esen, W Dobbelaere, R Vanhooren, ... ACM Transactions on Design Automation of Electronic Systems (TODAES) 25 (5 …, 2020 | 5 | 2020 |
| Avoiding mixed-signal field returns by outlier detection of hard-to-detect defects based on multivariate statistics N Xama, J Raymaekers, M Andraud, J Gomez, W Dobbelaere, ... 2020 IEEE European Test Symposium (ETS), 1-6, 2020 | 4 | 2020 |
| Latent defect screening with visually-enhanced dynamic part average testing A Coyette, W Dobbelaere, R Vanhooren, N Xama, J Gomez, G Gielen 2020 IEEE European Test Symposium (ETS), 1-6, 2020 | 4 | 2020 |
| Quick Analyses for Improving Reliability and Functional Safety of Mixed-Signal ICs S Sunter, M Wolinski, A Coyette, R Vanhooren, W Dobbelaere, N Xama, ... 2020 IEEE International Test Conference (ITC), 1-10, 2020 | 2 | 2020 |
| Boosting Latent Defect Coverage in Automotive Mixed-Signal ICs using SVM Classifiers N Xama, J Gomez, W Dobbelaere, R Vanhooren, A Coyette, G Gielen IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2023 | 1 | 2023 |
| Experimental validation of a compact pinhole latent defect model for MOS transistors J Gomez, N Xama, D Lootens, A Coyette, R Vanhooren, W Dobbelaere, ... IEEE Transactions on Electron Devices 69 (9), 4796-4802, 2022 | 1 | 2022 |
| DDtM: Increasing latent defect detection in analog/mixed-signal ICs using the difference in distance to mean value J Gomez, N Xama, A Coyette, R Vanhooren, W Dobbelaere, G Gielen IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2021 | 1 | 2021 |
| High-coverage analog IP block test generation methodology using low-cost signal generation and output response analysis J Gomez, N Xama, A Coyette, R Vanhooren, W Dobbelaere, G Gielen 2023 IEEE European Test Symposium (ETS), 1-4, 2023 | | 2023 |
| CMOS low-power threshold voltage monitors circuits and applications JAG Caicedo | | 2016 |
| ETS 2020 Best Paper A COYETTE, W DOBBELAERE, R VANHOOREN, N XAMA, J GOMEZ, ... | | |
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