Takip et
Faysal Boughorbel
Faysal Boughorbel
ASM Pacific Technology
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Başlık
Alıntı yapanlar
Alıntı yapanlar
Yıl
Multiscale fusion of visible and thermal IR images for illumination-invariant face recognition
SG Kong, J Heo, F Boughorbel, Y Zheng, BR Abidi, A Koschan, M Yi, ...
International Journal of Computer Vision 71, 215-233, 2007
2792007
SEM imaging method
F Boughorbel, CS Kooijman, BH Lich, EGT Bosch
US Patent 8,232,523, 2012
652012
Laser ranging and video imaging for bin picking
F Boughorbel, Y Zhang, S Kang, U Chidambaram, B Abidi, A Koschan, ...
Assembly Automation 23 (1), 53-59, 2003
542003
A new method for the registration of three-dimensional point-sets: The Gaussian fields framework
F Boughorbel, M Mercimek, A Koschan, M Abidi
Image and Vision Computing 28 (1), 124-137, 2010
452010
Gaussian fields: a new criterion for 3D rigid registration
F Boughorbel, A Koschan, B Abidi, M Abidi
Pattern Recognition 37 (7), 1567-1571, 2004
382004
Charged-particle microscope providing depth-resolved imagery
F Boughorbel, P Potocek, CS Kooijman, BH Lich
US Patent 8,586,921, 2013
302013
Digital reality: a model-based approach to supervised learning from synthetic data
T Dahmen, P Trampert, F Boughorbel, J Sprenger, M Klusch, K Fischer, ...
AI Perspectives 1, 1-12, 2019
292019
How should a fixed budget of dwell time be spent in scanning electron microscopy to optimize image quality?
PS Patrick Trampert, Faysal Bourghorbel, Pavel Potocek, Maurice Peemen ...
Ultramicroscopy 191, 11-17, 2018
292018
Deep neural networks for analysis of microscopy images—synthetic data generation and adaptive sampling
P Trampert, D Rubinstein, F Boughorbel, C Schlinkmann, M Luschkova, ...
Crystals 11 (3), 258, 2021
252021
3D multi-energy deconvolution electron microscopy
M de Goede, E Johlin, B Sciacca, F Boughorbel, EC Garnett
Nanoscale 9 (2), 684-689, 2017
232017
A new method for automatic 3d face registration
VR Ayyagari, F Boughorbel, A Koschan, MA Abidi
2005 IEEE Computer Society Conference on Computer Vision and Pattern …, 2005
232005
Method of examining a sample in a charged-particle microscope
I Lazic, EGT Bosch, F Boughorbel, B Buijsse, K Sader, S Lazar
US Patent 9,312,098, 2016
222016
Registration and integration of multisensor data for photorealistic scene reconstruction
F Boughorbal, DL Page, C Dumont, MA Abidi
28th AIPR Workshop: 3D Visualization for Data Exploration and Decision …, 2000
212000
Charged particle microscope providing depth-resolved imagery
F Boughorbel, EGT Bosch, P Potocek, X Zhuge, BH Lich
US Patent 8,704,176, 2014
202014
Mathematical image assembly in a scanning-type microscope
P Poto, CS Kooijman, HN Slingerland, GNA van Veen, F Boughorbel
US Patent 9,620,330, 2017
182017
Charged-particle microscopy with occlusion detection
DW Phifer, F Boughorbel
US Patent 8,698,078, 2014
182014
Charged particle microscopy imaging method
F Boughorbel, EGT Bosch, CS Kooijman, BH Lich, AF De Jong
US Patent 8,581,189, 2013
182013
Computational scanning microscopy with improved resolution
P Potocek, F Boughorbel, BH Lich, M Langhorst
US Patent 9,478,393, 2016
162016
Charged particle microscope with special aperture plate
P Potocek, FMHM Van Laarhoven, F Boughorbel, R Schoenmakers, ...
US Patent 9,934,936, 2018
142018
Bringing deconvolution algorithmic techniques to the electron microscope
B Lich, X Zhuge, P Potocek, F Boughorbel, C Mathisen
Biophysical Journal 104 (2), 500a, 2013
112013
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