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Sandip Argekar
Sandip Argekar
University of Cincinnati
intel.com üzerinde doğrulanmış e-posta adresine sahip
Başlık
Alıntı yapanlar
Alıntı yapanlar
Yıl
Structure and composition of trivalent chromium process (TCP) films on Al alloy
X Dong, P Wang, S Argekar, DW Schaefer
Langmuir 26 (13), 10833-10841, 2010
662010
Determination of structure-property relationships for 3-aminopropyltriethoxysilane films using x-ray reflectivity
SU Argekar, TL Kirley, DW Schaefer
Journal of Materials Research 28 (8), 1118-1128, 2013
242013
In situ evolution of trivalent chromium process passive film on Al in a corrosive aqueous environment
X Dong, S Argekar, P Wang, DW Schaefer
ACS Applied Materials & Interfaces 3 (11), 4206-4214, 2011
202011
Interfacial morphology of low-voltage anodic aluminium oxide
N Hu, X Dong, X He, S Argekar, Y Zhang, JF Browning, DW Schaefer
Journal of Applied Crystallography 46 (5), 1386-1396, 2013
112013
Influence of biologically relevant thin-film morphology on protein immobilization and cell-adhesion
S Argekar
University of Cincinnati, 2013
2013
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