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Co-authors
- Minghao QiPurdue UniversityVerified email at purdue.edu
- Andrew M. WeinerProfessor of Electrical and Computer Engineering, Purdue UniversityVerified email at purdue.edu
- Yi XUANUniversity of Pittsburgh, School of MedicineVerified email at pitt.edu
- Sangsik KimAssociate Professor of Electrical Engineering, Korea Advanced Institute of Science and TechnologyVerified email at kaist.ac.kr
- Jose Jaramillo-VillegasPurdue University, Universidad Tecnológica de PereiraVerified email at utp.edu.co
- Min TengimecVerified email at imec-int.com
- Abdullah Al NomanFailure Analysis R&D Engineer at Intel CorporationVerified email at intel.com
- Victor YurlovPrincipal Engineer of Samsung Electromechanics (Optics, MEMS, ISP)Verified email at samsung.com
- Vladimir A. AksyukProject Leader, Physical Measurement Laboratory, NISTVerified email at nist.gov
- Thomas LeBrunGroup Leader for Photonics and Optomechanics, NISTVerified email at nist.gov
- Junyeob SongNational Institute of Standards and Technology & University of DelawareVerified email at NIST.GOV
- David LongNational Institute of Standards and TechnologyVerified email at nist.gov
- Nan Ei Yu (N. E. Yu)Gwngju Institute of Science and Technology (GIST)Verified email at gist.ac.kr