Follow
Jihoon Chung
Title
Cited by
Cited by
Year
Self-scalable tanh (stan): Multi-scale solutions for physics-informed neural networks
R Gnanasambandam, B Shen, J Chung, X Yue, Z Kong
IEEE Transactions on Pattern Analysis and Machine Intelligence 45 (12 …, 2023
34*2023
Anomaly Detection in Additive Manufacturing Processes using Supervised Classification with Imbalanced Sensor Data based on Generative Adversarial Network
J Chung, B Shen, Z Kong
Journal of Intelligent Manufacturing, 2023
322023
Reinforcement Learning-based Defect Mitigation for Quality Assurance of Additive Manufacturing
J Chung, B Shen, ACC Law, Z Kong
Journal of Manufacturing Systems, 2022
322022
Crime risk maps: A multivariate spatial analysis of crime data
J Chung, H Kim
Geographical analysis 51 (4), 475-499, 2019
182019
Process parameter optimization for reproducible fabrication of layer porosity quality of 3D-printed tissue scaffold
ACC Law, R Wang, J Chung, E Kucukdeger, Y Liu, T Barron, BN Johnson, ...
Journal of Intelligent Manufacturing 35 (4), 1825-1844, 2024
102024
Imbalanced spectral data analysis using data augmentation based on the generative adversarial network
J Chung, J Zhang, AI Saimon, Y Liu, BN Johnson, Z Kong
Scientific Reports 14 (1), 13230, 2024
32024
A Novel Sparse Bayesian Learning and Its Application to Fault Diagnosis for Multistation Assembly Systems
J Chung, B Shen, Z Kong
IISE Transactions, 2023
32023
Ensuring Additive Manufacturing Quality and Cyber-Physical Security via Side-Channel Measurements and Transmissions
N Raeker-Jordan, J Chung, ZJ Kong, CB Williams
Journal of Manufacturing Systems, 2024
22024
On Model Compression for Neural Networks: Framework, Algorithm, and Convergence Guarantee
C Li, J Chung, B Cai, H Wang, X Zhou, B Shen
arXiv preprint arXiv:2303.06815, 2024
22024
A Sparse Bayesian Learning for Diagnosis of Nonstationary and Spatially Correlated Faults with Application to Multistation Assembly Systems
J Chung, Z Kong
IEEE Transactions on Automation Science and Engineering, 2024
12024
Predicting the stereoselectivity of chemical reactions by composite machine learning method
J Chung, J Li, AI Saimon, P Hong, Z Kong
Scientific reports 14 (1), 12131, 2024
12024
Process Monitoring and Control of Advanced Manufacturing based on Physics-Assisted Machine Learning
J Chung
Virginia Tech, 2023
2023
Automatic Thresholding by Reconstruction Error in Unsupervised Anomaly Detection
J Chung, R Gnanasambandam, ZJ Kong
IISE Annual Conference and Expo, 2023
2023
The system can't perform the operation now. Try again later.
Articles 1–13