Sadık İlik
Title
Cited by
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Year
Statistical MOSFET modeling methodology for cryogenic conditions
A Kabaoğlu, NŞ Solmaz, S İlik, Y Uzun, MB Yelten
IEEE Transactions on Electron Devices 66 (1), 66-72, 2018
72018
Modeling of total ionizing dose degradation on 180-nm n-MOSFETs using BSIM3
S İlik, A Kabaoğlu, NŞ Solmaz, MB Yelten
IEEE Transactions on Electron Devices 66 (11), 4617-4622, 2019
22019
Radiation tolerance impact of trap density near the drain and source regions of a MOSFET
S İlik, FB Gencer, NŞ Solmaz, A Çağlar, MB Yelten
Nuclear Instruments and Methods in Physics Research Section B: Beam …, 2019
22019
Variability-aware cryogenic models of mosfets: validation and circuit design
A Kabaoğlu, N Şahin-Solmaz, S İlik, Y Uzun, MB Yelten
Semiconductor Science and Technology 34 (11), 115004, 2019
2019
Comparison of ELTs with different shapes and a regular layout transistor in 180 nm CMOS process
S İlık, NŞ Solmaz, A Kabaoğlu, MB Yelten
2019 16th International Conference on Synthesis, Modeling, Analysis and …, 2019
2019
Design of Logic Gates by Using a Four-Gate Thin Film Transistor (FG TFT)
S Іlik, FB Gencer, MB Yelten
2018 15th International Conference on Synthesis, Modeling, Analysis and …, 2018
2018
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Articles 1–6