| Nanometer-sized phase-change recording using a scanning near-field optical microscope with a laser diode S Hosaka, T Shintani, M Miyamoto, A Hirotsune, M Terao, M Yoshida, ... Japanese Journal of Applied Physics 35 (1S), 443, 1996 | 147 | 1996 |
| Tip‐enhanced Raman spectroscopy–an interlaboratory reproducibility and comparison study C Blum, L Opilik, JM Atkin, K Braun, SB Kämmer, V Kravtsov, N Kumar, ... Journal of Raman Spectroscopy 45 (1), 22-31, 2014 | 131 | 2014 |
| Phase change recording using a scanning near‐field optical microscope S Hosaka, T Shintani, M Miyamoto, A Kikukawa, A Hirotsune, M Terao, ... Journal of applied physics 79 (10), 8082-8086, 1996 | 120 | 1996 |
| Imaging soft samples in liquid with tuning fork based shear force microscopy WHJ Rensen, NF Van Hulst, SB Kämmer Applied Physics Letters 77 (10), 1557-1559, 2000 | 95 | 2000 |
| Introduction to bruker’s scanasyst and peakforce tapping afm technology SB Kaemmer Bruker application note. Bruker Nano Inc., Santa Barbara, CA, 2011 | 71 | 2011 |
| Symmetry breaking of tissue mechanics in wound induced hair follicle regeneration of laboratory and spiny mice HIC Harn, SP Wang, YC Lai, B Van Handel, YC Liang, S Tsai, IM Schiessl, ... Nature communications 12 (1), 2595, 2021 | 59 | 2021 |
| Field-induced photoluminescence modulation of MEH− PPV under near-field optical excitation JD McNeill, DB O'Connor, DM Adams, PF Barbara, SB Kämmer The Journal of Physical Chemistry B 105 (1), 76-82, 2001 | 57 | 2001 |
| High‐resolution imaging using near‐field scanning optical microscopy and shear force feedback in water PJ Moyer, SB Kämmer Applied physics letters 68 (24), 3380-3382, 1996 | 54 | 1996 |
| Study of the lignin model compound supramolecular structure by combination of near-field scanning optical microscopy and atomic force microscopy M Micic, K Radotic, M Jeremic, D Djikanovic, SB Kämmer Colloids and Surfaces B: Biointerfaces 34 (1), 33-40, 2004 | 53 | 2004 |
| Scanning near-field optical microscope with a laser diode and nanometer-sized bit recording S Hosaka, T Shintani, M Miyamoto, A Hirotsune, M Terao, M Yoshida, ... Thin Solid Films 273 (1-2), 122-127, 1996 | 43 | 1996 |
| Detecting electrical forces in noncontact atomic force microscopy F Müller, AD Müller, M Hietschold, S Kämmer Measurement Science and Technology 9 (5), 734, 1998 | 34 | 1998 |
| Myoscaffolds reveal laminin scarring is detrimental for stem cell function while sarcospan induces compensatory fibrosis KM Stearns-Reider, MR Hicks, KG Hammond, JC Reynolds, A Maity, ... NPJ Regenerative medicine 8 (1), 16, 2023 | 15 | 2023 |
| Growth kinetics of the (110) face of the B and C polymorphs of stearic acid growing from octanone-2 solutions W Beckmann, S Kämmer, J Meier, R Boistelle Journal of crystal growth 74 (2), 326-330, 1986 | 14 | 1986 |
| Phase change writing in a GeSbTe film with scanning near-field optical microscope T Shintani, K Nakamura, S Hosaka, A Hirotsune, M Terao, R Imura, ... Ultramicroscopy 61 (1-4), 285-289, 1995 | 13 | 1995 |
| Method and apparatus of physical property measurement using a probe-based nano-localized light source MB Raschke, SB Kaemmer, SC Minne, C Su US Patent 8,881,311, 2014 | 12 | 2014 |
| Imaging crystal growth features using scanning force microscopy (SFM) S Kipp, S Kämmer, R Lacmann, J Rolfs, U Tanneberger, W Beckmann Crystal Research and Technology 29 (7), 1005-1011, 1994 | 11 | 1994 |
| BioScience AFM - Capturing Dynamics from Single Molecules to Living Cells S DR, K SB, H A, B J, J T, H H Microscopy Today 23 (6), 18-25, 2015 | 10 | 2015 |
| Applications of scanning electrical force microscopy F Müller, AD Müller, M Hietschold, S Kämmer Microelectronics Reliability 37 (10-11), 1631-1634, 1997 | 9 | 1997 |
| Investigations of liquid crystals and liquid ambients using near-field scanning optical microscopy PJ Moyer, S Kämmer, K Walzer, M Hietschold Ultramicroscopy 61 (1-4), 291-294, 1995 | 8 | 1995 |
| The use of near-field scanning optical microscopy for failure analysis of ULSI circuits RM Cramer, LJ Balk, R Chin, R Boylan, SB Kämmer, FJ Reineke, M Utlaut International Symposium for Testing and Failure Analysis 30811, 19-24, 1996 | 6 | 1996 |
