| Spectral bio-imaging of the eye D Cabib, M Adel, RA Buckwald, E Horn US Patent 6,556,853, 2003 | 364 | 2003 |
| Ion‐beam‐induced hydrogen release from a‐C:H: A bulk molecular recombination model ME Adel, O Amir, R Kalish, LC Feldman Journal of Applied Physics 66 (7), 3248-3251, 1989 | 172 | 1989 |
| Overlay metrology and control method M Adel, M Ghinovker, E Kassel, B Golovanevsky, JC Robinson, CA Mack, ... US Patent 7,804,994, 2010 | 168 | 2010 |
| Greywater use in Israel and worldwide: standards and prospects G Oron, M Adel, V Agmon, E Friedler, R Halperin, E Leshem, D Weinberg Water research 58, 92-101, 2014 | 160 | 2014 |
| Overlay marks, methods of overlay mark design and methods of overlay measurements M Adel, M Ghinovker, WD Mieher US Patent 6,985,618, 2006 | 134 | 2006 |
| Continuously varying offset mark and methods of determining overlay ME Adel, JL Seligson, D Kandel US Patent 7,440,105, 2008 | 117 | 2008 |
| Apparatus and methods for detecting overlay errors using scatterometry WD Mieher, A Levy, B Golovanesky, M Friedmann, I Smith, M Adel, ... US Patent 7,317,531, 2008 | 115 | 2008 |
| Effects of heavy ion irradiation on amorphous hydrogenated (diamondlike) carbon films S Prawer, R Kalish, M Adel, V Richter Journal of applied physics 61 (9), 4492-4500, 1987 | 115 | 1987 |
| Overlay marks, methods of overlay mark design and methods of overlay measurements M Adel, M Ghinovker US Patent 6,921,916, 2005 | 111 | 2005 |
| Use of overlay diagnostics for enhanced automatic process control JL Seligson, M Ghinovker, J Robinson, P Izikson, ME Adel, B Simkin, ... US Patent 6,928,628, 2005 | 105 | 2005 |
| Spectral bio-imaging of the eye D Cabib, M Adel, RA Buckwald US Patent 6,198,532, 2001 | 92 | 2001 |
| Spectral bio-imaging of the eye D Cabib, M Adel, RA Buckwald US Patent 6,419,361, 2002 | 90 | 2002 |
| Film thickness mapping using interferometric spectral imaging D Cabib, RA Buckwald, ME Adel US Patent 5,856,871, 1999 | 89 | 1999 |
| Apparatus and methods for detecting overlay errors using scatterometry WD Mieher, A Levy, B Golovanesky, M Friedmann, I Smith, ME Adel, ... US Patent 7,242,477, 2007 | 88 | 2007 |
| Spectral imaging using illumination of preselected spectral content ME Adel, D Cabib, D Wine US Patent 6,142,629, 2000 | 83 | 2000 |
| On-device metrology AV Shchegrov, JM Madsen, SI Pandev, A Levy, D Kandel, ME Adel, ... US Patent 9,875,946, 2018 | 76 | 2018 |
| Overlay marks, methods of overlay mark design and methods of overlay measurements M Adel, M Ghinovker, WD Mieher, A Levy, D Wack US Patent 7,181,057, 2007 | 73 | 2007 |
| Overlay marks, methods of overlay mark design and methods of overlay measurements M Adel, M Ghinovker, WD Mieher, A Levy, D Wack US Patent 7,181,057, 2007 | 73 | 2007 |
| Apparatus and methods for detecting overlay errors using scatterometry WD Mieher, A Levy, B Golovanesky, M Friedmann, I Smith, ME Adel, ... US Patent 7,379,183, 2008 | 65 | 2008 |
| Apparatus and methods for detecting overlay errors using scatterometry WD Mieher, A Levy, B Golovanesky, M Friedmann, I Smith, ME Adel, ... US Patent 7,280,212, 2007 | 65 | 2007 |
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