| Robust and accurate line-and/or point-based pose estimation without manhattan assumptions Y Salaün, R Marlet, P Monasse Computer Vision–ECCV 2016: 14th European Conference, Amsterdam, The …, 2016 | 39 | 2016 |
| Multiscale line segment detector for robust and accurate SfM Y Salaün, R Marlet, P Monasse 2016 23rd International Conference on Pattern Recognition (ICPR), 2000-2005, 2016 | 37 | 2016 |
| Line-based robust sfm with little image overlap Y Salaün, R Marlet, P Monasse 2017 International Conference on 3D Vision (3DV), 195-204, 2017 | 21 | 2017 |
| The multiscale line segment detector Y Salaün, R Marlet, P Monasse Reproducible Research in Pattern Recognition: First International Workshop …, 2017 | 2 | 2017 |
| Line-based Robust SfM with Little Image Overlap—Supplementary Material— Y Salaün, R Marlet, P Monasse | | |
| Robust and Accurate Line-and Point-Based Pose Estimation without Manhattan Assumptions—Supplementary Material— Y Salaün, R Marlet, P Monasse | | |
Renaud MarletSenior researcher at Ecole des Ponts ParisTech (ENPC) / Principal Scientist at Valeo.aienpc.fr üzerinde doğrulanmış e-posta adresine sahip
