Quantitative mass and energy dispersive elastic recoil spectrometry: Resolution and efficiency considerations HJ Whitlow, G Possnert, CS Petersson
Nuclear Instruments and Methods in Physics Research Section B: Beam …, 1987
214 1987 The Schottky‐barrier height of the contacts between some rare‐earth metals (and silicides) and p ‐type silicon H Norde, J de Sousa Pires, F d’Heurle, F Pesavento, S Petersson, ...
Applied Physics Letters 38 (11), 865-866, 1981
190 1981 Diffusion in intermetallic compounds with the CaF2 structure: A marker study of the formation of NiSi2 thin films F d’Heurle, S Petersson, L Stolt, B Strizker
Journal of applied physics 53 (8), 5678-5681, 1982
160 1982 Formation of iridium silicides from Ir thin films on Si substrates S Petersson, J Baglin, W Hammer, F d’Heurle, TS Kuan, I Ohdomari, ...
Journal of Applied Physics 50 (5), 3357-3365, 1979
131 1979 Monte Carlo simulation of electron transport in 4H–SiC using a two‐band model with multiple minima HE Nilsson, U Sannemo, CS Petersson
Journal of applied physics 80 (6), 3365-3369, 1996
94 1996 The formation of silicides in Mo-W Bilayer films on si substrates: A marker experiment J Baglin, J Dempsey, W Hammer, F d’Heurle, S Petersson, C Serrano
Journal of Electronic Materials 8, 641-661, 1979
85 1979 Characterization of 3D thermal neutron semiconductor detectors J Uher, C Fröjdh, J Jakůbek, C Kenney, Z Kohout, V Linhart, S Parker, ...
Nuclear Instruments and Methods in Physics Research Section A: Accelerators …, 2007
84 2007 Formation of wide and deep pores in silicon by electrochemical etching P Kleimann, J Linnros, S Petersson
Materials Science and Engineering: B 69, 29-33, 2000
77 2000 Nucleation‐controlled thin‐film interactions: Some silicides R Anderson, J Baglin, J Dempsey, W Hammer, F d’Heurle, S Petersson
Applied Physics Letters 35 (3), 285-287, 1979
72 1979 An alternative marker experiment in the formation of Mo and W silicides J Baglin, F d’Heurle, S Petersson
Applied Physics Letters 33 (4), 289-290, 1978
70 1978 An interface—marker technique applied to the study of metal silicide growth JEE Baglin, FM d'Heurle, WN Hammer, S Petersson
Nuclear Instruments and Methods 168 (1-3), 491-497, 1980
68 1980 The thin‐film formation of rhodium silicides S Petersson, R Anderson, J Baglin, J Dempsey, W Hammer, F d’Heurle, ...
Journal of Applied Physics 51 (1), 373-382, 1980
60 1980 Schottky-barrier behavior of metals on n - and p -type MO Aboelfotoh, C Fröjdh, CS Petersson
physical Review B 67 (7), 075312, 2003
57 2003 Studies of formation of silicides and their barrier heights to silicon KE Sundström, S Petersson, PA Tove
physica status solidi (a) 20 (2), 653-668, 1973
53 1973 An X-ray imaging pixel detector based on scintillator filled pores in a silicon matrix P Kleimann, J Linnros, C Fröjdh, CS Petersson
Nuclear Instruments and Methods in Physics Research Section A: Accelerators …, 2001
51 2001 Schottky‐barrier height of iridium silicide I Ohdomari, KN Tu, FM d’Heurle, TS Kuan, S Petersson
Applied Physics Letters 33 (12), 1028-1030, 1978
51 1978 Improvement of an X-ray imaging detector based on a scintillating guides screen X Badel, A Galeckas, J Linnros, P Kleimann, C Fröjdh, CS Petersson
Nuclear Instruments and Methods in Physics Research Section A: Accelerators …, 2002
50 2002 An X-ray imaging pixel detector based on a scintillating guides screen P Kleimann, J Linnros, C Frojdh, CS Petersson
1999 IEEE Nuclear Science Symposium. Conference Record. 1999 Nuclear Science …, 1999
48 1999 Observations of stresses in thin films of palladium and platinum silicides on silicon J Angilello, F d’Heurle, S Petersson, A Segmüller
Journal of Vacuum Science and Technology 17 (1), 471-475, 1980
48 1980 IrSi1.75 a new semiconductor compound S Petersson, JA Reimer, MH Brodsky, DR Campbell, F d’Heurle, ...
Journal of Applied Physics 53 (4), 3342-3343, 1982
44 1982