Huawei Li
Title
Cited by
Cited by
Year
DeepBurning: automatic generation of FPGA-based learning accelerators for the neural network family
Y Wang, J Xu, Y Han, H Li, X Li
Proceedings of the 53rd Annual Design Automation Conference, 110, 2016
1442016
An abacus turn model for time/space-efficient reconfigurable routing
B Fu, Y Han, J Ma, H Li, X Li
Proceeding of the 38th annual international symposium on Computer …, 2011
1052011
On topology reconfiguration for defect-tolerant NoC-based homogeneous manycore systems
L Zhang, Y Han, Q Xu, X Li, H Li
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on 17 (9 …, 2009
852009
Zonedefense: A fault-tolerant routing for 2-d meshes without virtual channels
B Fu, Y Han, H Li, X Li
IEEE Transactions on Very Large Scale Integration (VLSI) Systems 22 (1), 113-126, 2014
422014
SoftPCM: Enhancing energy efficiency and lifetime of phase change memory in video applications via approximate write
Y Fang, H Li, X Li
2012 IEEE 21st Asian Test Symposium, 131-136, 2012
412012
A fault criticality evaluation framework of digital systems for error tolerant video applications
Y Fang, H Li, X Li
2011 Asian Test Symposium, 329-334, 2011
392011
应用 Variable-Tail 编码压缩的测试资源划分方法
韩银和, 李晓维, 徐勇军, 李华伟
电子学报 32 (8), 1346-1350, 2004
38*2004
An on-chip clock generation scheme for faster-than-at-speed delay testing
S Pei, H Li, X Li
2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010 …, 2010
362010
Robust test generation for precise crosstalk-induced path delay faults
H Li, P Shen, X Li
VLSI Test Symposium, 2006. Proceedings. 24th IEEE, 6 pp.-305, 2006
362006
Test resource partitioning based on efficient response compaction for test time and tester channels reduction
YH Han, XW Li, HW Li, A Chandra
Journal of Computer Science and Technology 20 (2), 201-209, 2005
362005
Fault Tolerance Mechanism in Chip Many-Core Processors*
L Zhang, Y Han, H Li, X Li
Tsinghua Science & Technology 12, 169-174, 2007
352007
Embedded test decompressor to reduce the required channels and vector memory of tester for complex processor circuit
Y Han, Y Hu, X Li, H Li, A Chandra
IEEE Transactions on Very Large Scale Integration (VLSI) Systems 15 (5), 531-540, 2007
352007
Automatic Test Program Generation Using Executing-Trace-Based Constraint Extraction for Embedded Processors
Y Zhang, H Li, X Li
IEEE Transactions on Very Large Scale Integration Systems 21 (7), 1220-1233, 2013
332013
nGFSIM: A GPU-Based Fault Simulator for 1-to-n Detection and its Applications
H Li, D Xu, Y Han, KT Cheng, X Li
Test Conference (ITC), 2010 IEEE International, 1-10, 2010
322010
Economizing TSV resources in 3-D network-on-chip design
Y Wang, YH Han, L Zhang, BZ Fu, C Liu, HW Li, X Li
IEEE Transactions on Very Large Scale Integration (VLSI) Systems 23 (3), 493-506, 2015
272015
A high-precision on-chip path delay measurement architecture
S Pei, H Li, X Li
IEEE Transactions on Very Large Scale Integration (VLSI) Systems 20 (9 …, 2012
272012
Path constraint solving based test generation for hard-to-reach states
Y Zhou, T Wang, T Lv, H Li, X Li
2013 22nd Asian Test Symposium, 239-244, 2013
252013
Software-based self-testing of processors using expanded instructions
Y Zhang, H Li, X Li
2010 19th IEEE Asian Test Symposium, 415-420, 2010
252010
A low overhead on-chip path delay measurement circuit
S Pei, H Li, X Li
Asian Test Symposium, 2009. ATS'09., 145-150, 2009
242009
ProPRAM: exploiting the transparent logic resources in non-volatile memory for near data computing
Y Wang, Y Han, L Zhang, H Li, X Li
Proceedings of the 52nd Annual Design Automation Conference, 47, 2015
212015
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Articles 1–20