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Clive Hayzelden
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Silicide formation and silicide‐mediated crystallization of nickel‐implanted amorphous silicon thin films
C Hayzelden, JL Batstone
Journal of Applied Physics 73 (12), 8279-8289, 1993
5981993
In situ transmission electron microscopy studies of silicide‐mediated crystallization of amorphous silicon
C Hayzelden, JL Batstone, RC Cammarata
Applied physics letters 60 (2), 225-227, 1992
2371992
Viable bacterial colonization is highly limited in the human intestine in utero
E Rackaityte, J Halkias, EM Fukui, VF Mendoza, C Hayzelden, ...
Nature medicine 26 (4), 599-607, 2020
2152020
Silicide precipitation and silicon crystallization in nickel implanted amorphous silicon thin films
RC Cammarata, CV Thompson, C Hayzelden, KN Tu
Journal of Materials Research 5, 2133-2138, 1990
1191990
Rapid solidification microstructures in austenitic Fe-Ni alloys
C Hayzelden, JJ Rayment, B Cantor
Acta Metallurgica 31 (3), 379-386, 1983
891983
The martensite transformation in Fe-Ni-C alloys
C Hayzelden, B Cantor
Acta Metallurgica 34 (2), 233-242, 1986
471986
Growth of quartz from amorphous silica at ambient pressure
G Devaud, C Hayzelden, MJ Aziz, D Turnbull
Journal of non-crystalline solids 134 (1-2), 129-132, 1991
381991
Microscopic Processes in Crystallisation
JL Batstone, C Hayzelden
Solid State Phenomena 37, 257-268, 1994
341994
Enhanced mechanical and magnetic properties of granular metal thin films
TE Schlesinger, RC Cammarata, A Gavrin, JQ Xiao, CL Chien, MK Ferber, ...
Journal of applied physics 70 (6), 3275-3280, 1991
341991
Nanoindentation study of sputtered nanocrystalline iron thin films
JB Savader, MR Scanlon, RC Cammarata, DT Smith, C Hayzelden
Scripta materialia 36 (1), 1997
291997
Transmission electron microscopy observations of the fcc-to-hcp martensite transformation in Co-Ni alloys
C Hayzelden, K Chattopadhyay, JC Barry, B Cantor
Philosophical Magazine A 63 (3), 461-470, 1991
251991
Corroborating evidence refutes batch effect as explanation for fetal bacteria
E Rackaityte, J Halkias, EM Fukui, VF Mendoza, C Hayzelden, ...
Microbiome 9, 1-4, 2021
212021
Elastic and hardness properties of Fe-Ag (001) multilayered thin films
MR Scanlon, RC Cammarata, DJ Keavney, JW Freeland, JC Walker, ...
Applied physics letters 66 (1), 46-48, 1995
191995
Epoxy resin-metallic glass composites
W Kadir, C Hayzelden, B Cantor
J. Mat. Sci. Lett. 15, 2663, 1980
131980
Gate dielectric metrology
C Hayzelden
Handbook of Silicon Semiconductor Metrology, 17-47, 2001
112001
Characterization of copper oxidation and reduction using spectroscopic ellipsometry
RA Powell, D Settles, L Lane, CL Ygartua, AR Srivatsa, C Hayzelden
Process Control and Diagnostics 4182, 97-105, 2000
112000
The massive transformation in melt spun Fe-Ni alloys
C Hayzelden, B Cantor
International journal of rapid solidification 1 (3), 237-263, 1985
51985
High-Resolution Profilometry for CMP and Etch Metrology
A Mathai, C Hayzelden
Handbook of Silicon Semiconductor Metrology, 231-243, 2001
42001
Application of model-based lithographic process control for cost-effective ic manufacturing at 0.13 um and beyond
KM Monahan, PJ Lord, C Hayzelden, W Ng
Metrology, Inspection, and Process Control for Microlithography XIII 3677 …, 1999
41999
Electron microscopy of semiconducting materials and ULSI devices
C Hayzelden, C Hetherington, F Ross
Materials Research Society Proceedings, 1998
4*1998
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