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Sadid Muneer
Sadid Muneer
Associate Professor, Dept. of Electrical and Electronic Engr., United International University
Verified email at eee.uiu.ac.bd - Homepage
Title
Cited by
Cited by
Year
High speed, high temperature electrical characterization of phase change materials: metastable phases, crystallization dynamics, and resistance drift
F Dirisaglik, G Bakan, Z Jurado, S Muneer, M Akbulut, J Rarey, L Sullivan, ...
Nanoscale 7 (40), 16625-16630, 2015
792015
Concentrating solar power (CSP) and its prospect in Bangladesh
N Noor, S Muneer
Developments in Renewable Energy Technology (ICDRET), 2009 1st International …, 2009
582009
Activation energy of metastable amorphous Ge2Sb2Te5 from room temperature to melt
S Muneer, J Scoggin, F Dirisaglik, L Adnane, A Cywar, G Bakan, K Cil, ...
AIP Advances 8 (6), 2018
202018
Security Opportunities in Nano Devices and Emerging Technologies
M Tehranipoor, D Forte, GS Rose, S Bhunia
172017
Vacuum-Insulated Self-Aligned Nanowire Phase-Change Memory Devices
S Muneer, A Gokirmak, H Silva
Electron Devices, IEEE Transactions on 62 (5), 1668-1671, 2015
132015
Phase change memory and its applications in hardware security
RS Khan, N Noor, C Jin, J Scoggin, Z Woods, S Muneer, A Ciardullo, ...
Security Opportunities in Nano Devices and Emerging Technologies, 93-114, 2017
112017
Analysis of self-heating of thermally assisted spin-transfer torque magnetic random access memory
A Deschenes, S Muneer, M Akbulut, A Gokirmak, H Silva
Beilstein Journal of Nanotechnology 7 (1), 1676-1683, 2016
92016
Enhanced Reset Variability in Phase Change Memory for Hardware Security Applications
N Noor, S Muneer, RS Khan, A Gokirmak, H Silva
APS 2019, K33. 008, 2019
72019
Short and Long Time Resistance Drift Measurement in Intermediate States of Ge2Sb2Te5 Phase Change Memory Line Cells
N Noor, RS Khan, S Muneer, L Adnane, R Ramadan, F Dirisaglik, ...
Mat. Res. Soc. Spring Meeting, 2017
72017
Reset variability in phase change memory for hardware security applications
N Noor, S Muneer, RS Khan, A Gorbenko, MTB Kashem, J Scoggin, ...
IEEE Transactions on Nanotechnology 20, 75-82, 2020
62020
A Study on Stochasticity in Hexagonal Close Packed Ge2Sb2Te5 Nanowires for Possible Physical Unclonable Function (PUF) Implementation
RS Khan, N Noor, A Ciardullo, S Muneer, L Adnane, F Dirisaglik, A Cywar, ...
Mat. Res. Soc. Spring Meeting, 2017
52017
Resistance drift and crystallization in suspended and On-oxide phase change memory line cells
A Gorbenko, N Noor, S Muneer, RS Khan, F Dirisaglik, A Cywar, ...
2019 IEEE 19th International Conference on Nanotechnology (IEEE-NANO), 417-420, 2019
42019
ZnO Nanoforest Optical PUFs
N Noor, V Manthina, S Muneer, A Agrios, A Gokirmak, H Silva
Mat. Res. Soc. Fall Meeting, 2018
42018
Utilizing Programming Variability in Phase Change Memory Cells for Security
N Noor, S Muneer, L Adnane, RS Khan, A Gorbenko, F Dirisaglik, ...
Mat. Res. Soc. Fall Meeting, 2017
42017
Intrinsically reliable and lightweight physical obfuscated keys
RS Khan, N Kanan, C Jin, J Scoggin, N Noor, S Muneer, F Dirisaglik, ...
arXiv preprint arXiv:1703.07427, 2017
42017
Pulse-mode Electrical Resistance Trimming of Ge2Sb2Te5 Phase Change Memory (PCM) Line Cells
N Noor, S Muneer, L Adnane, RS Khan, R Ramadan, F Dirisaglik, ...
International Semiconductor Device Research Symposium (ISDRS), 2016
42016
Incorporation of GTR (generation–transport–recombination) in semiconductor simulations
S Muneer, G Bakan, A Gokirmak, H Silva
Journal of Applied Physics 129 (5), 2021
32021
Enhancing Programming Variability in Multi-Bit Phase Change Memory Cells for Security
N Noor, S Muneer, RS Khan, A Gorbenko, H Silva
IEEE Transactions on Nanotechnology 19, 820-828, 2020
32020
Exploiting lithography limits for hardware security applications
RS Khan, N Noor, C Jin, S Muneer, F Dirisaglik, A Cywar, PH Nguyen, ...
2019 IEEE 19th International Conference on Nanotechnology (IEEE-NANO), 9-12, 2019
32019
Evidence of Charge Trapping Giving Rise to Resistance Drift of Metastable Amorphous Ge2Sb2Te 5
RS Khan, S Muneer, N Noor, H Silva, A Gokirmak
APS 2019, K33. 001, 2019
32019
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