| Performance characteristics of atomic layer functionalized microchannel plates OHW Siegmund, N Richner, G Gunjala, JB McPhate, AS Tremsin, ... UV, X-Ray, and Gamma-Ray Space Instrumentation for Astronomy XVIII 8859, 263-274, 2013 | 46 | 2013 |
| Aberration recovery by imaging a weak diffuser G Gunjala, S Sherwin, A Shanker, L Waller Optics Express 26 (16), 21054-21068, 2018 | 17 | 2018 |
| Optical transfer function characterization using a weak diffuser G Gunjala, A Shanker, V Jaedicke, N Antipa, L Waller Three-Dimensional and Multidimensional Microscopy: Image Acquisition and …, 2016 | 8 | 2016 |
| Extreme ultraviolet microscope characterization using photomask surface roughness G Gunjala, A Wojdyla, S Sherwin, A Shanker, MP Benk, KA Goldberg, ... Scientific reports 10 (1), 11673, 2020 | 6 | 2020 |
| Off-axis aberration estimation in an EUV microscope using natural speckle A Shanker, A Wojdyla, G Gunjala, J Dong, M Benk, A Neureuther, ... Imaging Systems and Applications, ITh1F. 2, 2016 | 4 | 2016 |
| Data-driven modeling and control of an x-ray bimorph adaptive mirror G Gunjala, A Wojdyla, KA Goldberg, Z Qiao, X Shi, L Assoufid, L Waller Journal of Synchrotron Radiation 30 (1), 57-64, 2023 | 3 | 2023 |
| Exceeding the limits of algorithmic self-calibrated aberration recovery in Fourier ptychography E Li, S Sherwin, G Gunjala, L Waller Optics Continuum 2 (1), 119-130, 2023 | 2 | 2023 |
| Speckle metrology for extreme ultra-violet lithography A Shanker, L Waller, G Gunjala, A Wojdyla, D Voronov, P Naulleau Extreme Ultraviolet (EUV) Lithography IX 10583, 206-214, 2018 | 1 | 2018 |
| Design of a Domed LED Illuminator for High-Angle Computational Illumination ZF Phillips, G Gunjala, P Varma, J Zhong, L Waller Imaging Systems and Applications, ITh1A. 2, 2015 | 1 | 2015 |
| Towards diffraction-limited short-wavelength imaging systems GK Gunjala University of California, Berkeley, 2022 | | 2022 |
| Exceeding the limits of algorithmic self-calibration in super-resolution imaging E Li, S Sherwin, G Gunjala, L Waller arXiv preprint arXiv:2109.07188, 2021 | | 2021 |
| Field-varying aberration recovery in EUV microscopy using mask roughness G Gunjala, A Wojdyla, A Shanker, S Sherwin, MP Benk, KA Goldberg, ... Computational Optical Sensing and Imaging, CW2E. 2, 2018 | | 2018 |
| Actinic Inspection tool characterization using mask speckle A Shanker, G Gunjala, A Wojdyla, M Benk, K Goldberg, L Waller | | 2016 |
