| Accurate testing of analog-to-digital converters using low linearity signals with stimulus error identification and removal L Jin, K Parthasarathy, T Kuyel, D Chen, RL Geiger IEEE Transactions on Instrumentation and Measurement 54 (3), 1188-1199, 2005 | 150 | 2005 |
| Linearity testing issues of analog to digital converters T Kuyel International Test Conference 1999. Proceedings (IEEE Cat. No. 99CH37034 …, 1999 | 95 | 1999 |
| A 14 b 40 MSample/s pipelined ADC with DFCA PC Yu, S Shehata, A Joharapurkar, P Chugh, AR Bugeja, X Du, SU Kwak, ... 2001 IEEE International Solid-State Circuits Conference. Digest of Technical …, 2001 | 72 | 2001 |
| All-analog calibration of sting-DAC linearity: application to high voltage processes T Kuyel, A Yilmaz US Patent 6,897,794, 2005 | 61 | 2005 |
| Method and system for measuring jitter T Kuyel US Patent 6,640,193, 2003 | 56 | 2003 |
| Linearity testing of precision analog-to-digital converters using stationary nonlinear inputs L Jin, K Parthasarathy, T Kuyel, D Chen, RL Geiger International Test Conference, 2003. Proceedings. ITC 2003., 218-218, 2003 | 51 | 2003 |
| BIST and production testing of ADCs using imprecise stimulus K Parthasarathy, T Kuyel, D Price, L Jin, D Chen, R Geiger ACM Transactions on Design Automation of Electronic Systems (TODAES) 8 (4 …, 2003 | 36 | 2003 |
| High-performance ADC linearity test using low-precision signals in non-stationary environments L Jin, K Parthasarathy, T Kuyel, R Geiger, D Chen IEEE International Conference on Test, 2005., 10 pp.-1191, 2005 | 35 | 2005 |
| High-speed, high-resolution voltage output digital-to-analog converter and method T Kuyel US Patent 7,283,082, 2007 | 33 | 2007 |
| A 16-bit resistor string DAC with full-calibration at final test K Parthasarathy, T Kuyel, Z Yu, D Chen, R Geiger IEEE International Conference on Test, 2005., 10 pp.-75, 2005 | 27 | 2005 |
| Method and apparatus to measure jitter. M Burns, DT Kao, T Kuyel US Patent 6,240,130, 2001 | 23 | 2001 |
| Compensation of offset drift with temperature for operational amplifiers T Kuyel, G Morcan, T Feyiz US Patent 6,952,130, 2005 | 22 | 2005 |
| Piecewise linear calibration method and circuit to correct transfer function errors of digital to analog converters T Kuyel, KL Parthasarathy US Patent 6,642,869, 2003 | 21 | 2003 |
| Retinally reconstructed images: Digital images having a resolution match with the human eye T Kuyel, W Geisler, J Ghosh IEEE TRANSACTIONS ON SYSTEMS MAN AND CYBERNETICS PART A SYSTEMS AND HUMANS …, 1999 | 19 | 1999 |
| All-digital calibration of string DAC linearity using area efficient PWL approximation: eliminating hardware search and digital division T Kuyel US Patent 7,002,496, 2006 | 17 | 2006 |
| Relating linearity test results to design flaws of pipelined analog to digital converters T Kuyel, H Bilhan International Test Conference 1999. Proceedings (IEEE Cat. No. 99CH37034 …, 1999 | 17 | 1999 |
| Method for testing analog and mixed-signal circuits using functionally related excitations and functionally related measurements R Geiger, K Parthasarathy, D Chen, L Jin, T Kuyel US Patent 7,129,734, 2006 | 14 | 2006 |
| A histogram based AM-BIST algorithm for ADC characterization using imprecise stimulus KL Parthasarathy, L Jin, T Kuyel, D Chen, R Geiger The 2002 45th Midwest Symposium on Circuits and Systems, 2002. MWSCAS-2002 …, 2002 | 12 | 2002 |
| Retinally reconstructed images (RRIs): digital images having a resolution match with the human eye T Kuyel, WS Geisler, J Ghosh Human Vision and Electronic Imaging III 3299, 603-614, 1998 | 12 | 1998 |
| Experimental evaluation and validation of a BIST algorithm for characterization of A/D converter performance KL Parthasarathy, L Jin, T Kuyel, D Price, D Chen, R Geiger 2003 IEEE International Symposium on Circuits and Systems (ISCAS) 5, V-V, 2003 | 9 | 2003 |
